This page lists the scientific contributions of an author, who either does not have a ResearchGate profile, or has not yet added these contributions to their profile.
It was automatically created by ResearchGate to create a record of this author's body of work. We create such pages to advance our goal of creating and maintaining the most comprehensive scientific repository possible. In doing so, we process publicly available (personal) data relating to the author as a member of the scientific community.
If you're a ResearchGate member, you can follow this page to keep up with this author's work.
If you are this author, and you don't want us to display this page anymore, please let us know.
January 1989
·
22 Reads
·
10 Citations
Scanning Microscopy
The recent exploitation of near field optics opened a new branch of light microscopy beyond the diffraction limit. With scanning near field optical microscopy a lateral resolution of 20 and 50 nm was obtained in transmission and refelection, respectively. In a novel optical tunneling mode, also the topography of pure phase objects has been imaged at a resolution of 50 nm laterally and 1 nm vertically.
July 1988
·
104 Reads
·
31 Citations
The elastic scattering efficiency from subwavelength-size surface holes or protrusions depends sensitively on the dielectric properties of their immediate environment. Scanning near-field optical microscopy exploits this effect to create optical images whose resolution is not restricted by the diffraction limit. Typically, 20 nm laterally and, when operated in a topographic mode, 0.1 nm in height can be resolved. Images were obtained both in transmission and reflection.
February 1988
·
691 Reads
·
143 Citations
Applied Physics Letters
The resolution of near‐field optical scanning microscopy (NFOS) is determined by the dimensions of the microscopic light source rather than the diffraction limit. To demonstrate NFOS in reflection, intensity changes in the (backward) scattering from a 70–100 nm diam hole in a metal film were recorded while the sample was scanned in close proximity to this aperture. Raster‐scan images of a planar metal test pattern yield a resolution comparable to the size of the aperture.
June 1986
·
48 Reads
·
755 Citations
Journal of Applied Physics
Near‐field optical‐scanning (NFOS) microscopy or ‘‘optical stethoscopy’’ provides images with resolution in the 20‐nm range, i.e., a very small fraction of an optical wavelength. Scan images of metal films with fine structures presented in this paper convincingly demonstrate this resolution capability. Design of an NFOS microscope with tunnel distance regulation, its theoretical background, application potential, and limitations are discussed.
... When a wedged pattern is observed using NOM, the resolution of NOM is clearly represented as the narrowest resolvable gap width within one image of a continuously narrowing gap. Although a few NOM test samples with dimensions of tens of nanometres have been observed, for example gold balls (Lewis & Lieberman, 1991) or latex projection test samples (Fischer et al., 1989; Moyer & Kaemmer, 1996; Madsen et al., 1998), it is dif®cult to obtain adequate patterns arti®cially. Lithography is a well-known technique for providing desired patterns. ...
January 1989
Scanning Microscopy
... tion/asperity, polarization and angle of incidence adjusted for plasmon excitation. From Pohl et al. (1988). Copyright @ 1988, The Society ofPhoto-Optical Instrumentation Engineers. ...
July 1988
... This turns out to be challenging when one considers increasingly smaller structures, i.e., samples with subwavelength spatial features. For specific applications, several techniques have been found such as the use of shorter wavelengths for illumination (extreme ultraviolet and x ray) [5,6], superresolution techniques that make use of fluorophores [7,8], or by measuring in the near-field regime at distances from the sample where one can exploit the evanescent fields [9][10][11]. However, these techniques also show specific drawbacks such as the use of wavelengths that allow low penetration depth into the samples and might cause damage to them, the need to use external markers that contaminate the samples or the requirement of unbearable exposure times due to scanning of large samples. ...
June 1986
Journal of Applied Physics
... Due to the diffraction property of light, the conventional optics is restricted by the Abbe diffraction limit of 0.5λ/ NA, which relates to the illumination wavelength (λ) and the numerical aperture (NA) [1]. To overcome the limit, efforts have been made to develop optical superresolution devices and systems, such as a near-field optical probe [2], superlenses [3,4], hyperlenses [5,6], and fluorescent superresolution microscopes [7][8][9][10][11]. Nevertheless, these methods either work in the near-field regime or require fluorescent labels, causing restrictions for practical applications. ...
February 1988
Applied Physics Letters
