GaN is an important semiconductor material operating in the blue light range. GaN epitaxial layer was successfully achieved by MOCVD with TMGa and NH 3 as sources on (0112) α-Al 2O 3 substrate. The morphorlogical, crystalline, electrical and optical characterizations of the GaN film were investigated. The minimum FWHM of (2110) peak of double crystal X-ray diffraction rocking curve is 16'. Near ultraviolet and visible light are observed by cathode luminescence.