In this work, vertical aligned SiNWs array have been fabricated on silicon wafers via metal assisted chemical etching method. This method mainly contains four fabrication steps: wafer cleaning, oxide layer removal, silver catalyst deposition and metal assisted etching. The relationship between the etching time and nanowires length is investigated, and the nanowires can be fabricated in a controllable manner. The optical characteristic of the nanowires array is measured. The average optical reflectance of the SiNWs array is as low as about 3.28% when the etching time is 20 min, implying such prepared SiNWs array possesses an excellent antireflective property. The successful transfer of the SiNWs array from the rigid silicon substrate onto a flexible PDMS film demonstrates its potential in fabricating flexible optoelectronic devices.