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Etienne-Louis Malus: The Polarization of Light by Refraction and Reflection is Discovered [Historical Corner]
Abstract
This paper presents the memoir of Etienne-Louis Malus on a phenomenon linked to light polarization in birefringent materials and in ordinary reflection.
... Polarization as an intrinsic property of light (i.e., a kind of transverse wave) specifies the oscillation of the electric field in a transverse plane perpendicular to the propagation direction of an electromagnetic wave. The discovery of the polarization of light can be traced back to 1808 when Malus, a French physicist and mathematician, established the famous Malus's law [1] and opened the gate to polarization optics, a significant branch of optics. Thus, it laid the foundations for the successful development of the applications of polarized light. ...
A simple and compact polarimeter comprising two electrically controlled liquid-crystal variable retarders (LCVRs) and a linear polarizer is demonstrated, which is enabled by analyzing the intensity variation of the modulated output light based on a computational algorithm. A proof-of-concept prototype is presented, which is mounted onto a power meter or a CMOS camera for the intensity data collection. The polarimetric measurement for the spatial variant polarization states of light is also verified, indicating the possibility of achieving a resolution-lossless polarimeter. Thus, our proposed method shows a cost-effective way to realize a compact polarimeter in polarization optics.
Large-scale lateral alignment of nanorods (NRs) is of interest for manifestation of their anistropic properties including polarized emission and directional electrical transport. This study investigates the utility of mechanical rubbing for macroscopic scale alignment of colloidal semiconductor NRs. CdSe/CdS seeded-rods, exhibiting linearly polarized emission, are aligned by mechanical rubbing of a spin-coated glass substrate. The dragging force exerted by the rubbing fibers results in deflection and reorientation of the NRs along the rubbing direction. The rubbed samples were characterized by various methods including absorption, polarized emission, optical fluorescence microscopy, atomic force microscopy, and ultra-high resolution scanning electron microscopy. The emission polarization contrast ratio (CR), defined as the ratio between emission intensities parallel and perpendicular to the rubbing direction, was used to characterize the rods alignment. The effects of substrate treatments on the CR were studied, showing that partially hydrophobic surface provides optimal conditions for alignment. Excess organic ligands added to the deposited NR solution strongly affect the extent of alignment. This was studied for a series of NR samples of different dimensions and an optimal additive ratio of ∼3 ligand molecules per 1 nm2 NR surface area was found to yield the highest CR. Average CR values of 3.5 were detected over the entire 6 cm2 substrate area, with local values exceeding 4.5. While samples of rubbed spherical quantum dots and spin-coated films of NRs show no emission polarization, the emission intensity from rubbed NR samples is polarized obeying Malus' law (wherein, the intensity is proportional to cos2(θ)). Mechanical rubbing, well known for its use in LC devices, may be considered as a method for large-scale alignment of NRs on substrates.
Memoires de Physique et de Chimie de la Societe d
- E.-L Malus
E.-L. Malus, "Sur nne Propriete de la Lumiere Reflechie," Memoires de Physique et de Chimie de la Societe d 'Arcueil, II, Paris, Mad. v: Bernard, quai des Augustins, 1809, pp. 143-158.
Sur une Propriete de la Lumiere Reflechie
- E.-L Malus
Memoire sur de Nouveaux Phenomenes d'optique
- E.-L Malus