Atom-Specific Interaction Quantification and Identification by 3D-SPM

Abstract

Entire scientific disciplines such as mechanics and chemistry are
governed by the interactions between atoms and molecules. On surfaces,
forces extending into the vacuum direct the behavior of phenomena such
as thin film growth, nanotribology, and surface catalysis. To advance
our knowledge of the fundamentals governing these topics, it is
desirable to simultaneously map electron densities and quantify force
interactions between the surface of interest and a probe with atomic
resolution. Using the oxygen-reconstructed copper (100) surface as a
model system, we demonstrate that much of this information can be
derived from combining three-dimensional atomic force microscopy
(3D-AFM) with simultaneous STM. The three-dimensional scanning probe
microscopy (3D-SPM) variant resulting from this combination provides
complementary information in the various interaction channels recorded.
The surface oxide layer of copper (100) features defects and a distinct
structure of the Cu and O sublattices that is ideally suited for such
model investigations. The analysis of our experimental results allows
for the identification of atomic species and defects on the sample
surface through the comparison of simultaneously recorded force and
current data.