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Microwave power thin film resistors for high frequency and high power load
applications
H. C. Jiang, X. Si, W. L. Zhang, C. J. Wang, B. Peng et al.
Citation: Appl. Phys. Lett. 97, 173504 (2010); doi: 10.1063/1.3507883
View online: http://dx.doi.org/10.1063/1.3507883
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Microwave power thin film resistors for high frequency and high power
load applications
H. C. Jiang,a兲X. Si, W. L. Zhang, C. J. Wang, B. Peng, and Y. R. Li
State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science
and Technology of China, Chengdu 610054, People’s Republic of China
共Received 23 June 2010; accepted 8 October 2010; published online 27 October 2010兲
The authors report a power-dividing-based microwave power thin film resistor 共MPTFR兲that
exhibits high operating frequency and high power load. The MPTFR is comprised of substrate,
ground electrodes, two TaN resistive films, power dividing circuit and signal input port. The
experimental results show that the voltage standing wave ratio of the MPTFR is lower than 1.6 in
the band of 3.4–7.4 GHz and 8.2–9.8 GHz. The power load of the MPTFR is 200 W. The
experimental data are in good agreement with the electromagnetic simulations. © 2010 American
Institute of Physics.关doi:10.1063/1.3507883兴
As a power dissipation component, microwave power
thin film resistors 共MPTFRs兲have been widely used in radar,
communication and hybrid integrated circuit, etc.1–5It is
typically used as dummy load or power-absorbent at the nor-
mally isolated ports of, such as, circulators as well as cou-
plers to absorb the extra power caused by mismatches, im-
perfect directivity, or imbalances somewhere in these
systems. By this way, the rear-end components or systems
can be avoided from being burned or destroyed.
Two main parameters of the MPTFR are operating fre-
quency and power load. With the development of radar, com-
munication and hybrid integrated circuit, etc., MPTFRs with
higher operating frequency and power load and smaller size
are required. In a single resistive film MPTFR, the reflection
of the microwave power signal is described as Eq. 共1兲:6
兩⌫兩=e−0.169⌬Tk
fRP,共1兲
where ⌫,⌬T,k,f,R,, and Pare the reflection coefficient,
the gradient of temperature of the MPTFR due to microwave
power load, coefficient of heat conductivity of the substrates,
operating frequency, impedance, dielectric constant, and
power load, respectively.
From Eq. 共1兲, it is impossible to improve the operating
frequency and power load simultaneously in a single resis-
tive film MPTFR, that is, the increase in the power load
requires larger resistive film area, which means lower oper-
ating frequency. Accordingly, only high frequency but low
power or low frequency but high power load can be obtained
in MPTFRs with single resistive film. In this paper, a
MPTFR based on power dividing technique was proposed
and fabricated with the aim to endow the MPTFR with high
frequency and high power load simultaneously.
Figure 1shows the structure of the MPTFR based on
power dividing. The MPTFR is comprised of substrate,
ground electrode, two resistive films, power dividing circuit,
and microwave signal input port. The resistive film is com-
prised of two smaller resistive films with parallel connection.
The functions of the power dividing circuit are to divide the
input power into two parts and to match impedance. By that,
the input microwave power signal with high frequency and
high power is divided into two small equal power signal
共half of the input power兲but their frequency still equals to
the input frequency. Because the two equal microwave
power signals are dissipated at the two resistive films, the
power load of the MPTFR is doubled with respect to those
with single resistive film. On the other hand, the operating
frequency of the MPTFR remains unchanged due to the im-
pedance matching of the power dividing circuit.
We first simulated the performances of the MPTFR by
HFSS software. In the simulation, BeO ceramic substrate with
the size of 20 mm⫻10 mm⫻1 mm was used as the sub-
strate of the MPTFR. TaN thin films was used as the resistive
materials. The area of each TaN thin film was 9 mm.2The dc
resistance of each resistive film was 50 ⍀, so the dc resis-
tance of the overall MPTFR is 25 ⍀. Silver was used as the
electrode materials.
Figure 2shows the dependences of voltage standing
wave ratio 共VSWR兲and S11 of the MPTFR on the frequency
simulated by HFSS. It can be seen that the VSWR and S11 of
the MPTFR are lower than 1.6 and –12 dB in the band of
3–9 GHz, respectively. Figure 3shows the impedance as a
function of the frequency simulated by HFSS. From Fig. 3,
the real part of the impedance is about 50 ⍀and the imagi-
nary part is nearly zero at 5 GHz, where the S11 and the
VSWR are minimal. These results indicate that the MPTFR
can be matched to 50 ⍀at 5 GHz by the power dividing
circuit. The simulation results imply that the proposed
MPTFR based on power dividing can be applied in rf de-
vices in the band of 3–9 GHz.
a兲Electronic mail: hcjiang@uestc.edu.cn. FIG. 1. Sketch of the power-dividing MPTFR.
APPLIED PHYSICS LETTERS 97, 173504 共2010兲
0003-6951/2010/97共17兲/173504/3/$30.00 © 2010 American Institute of Physics97, 173504-1
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The MPTFR was fabricated by reactive magnetron sput-
tering and mask patterning technology. First, the silver elec-
trodes were fabricated by screen print technology. Then, TaN
thin films were prepared by dc reactive magnetron sputter-
ing. A Ta wafer 共⌽60 mm with purity of 99.995 at. %兲was
used as the target. The sputtering gas is a mixture of argon
共99.99%兲and nitrogen 共99.99%兲. The nitrogen partial flux
关N2/共N2+Ar兲兴 in the sputtering gas is 3%. The base vacuum
is 5⫻10−4 Pa. The distance between the target to the sub-
strate, the sputtering pressure, the sputtering time, the sub-
strate temperature and the sputtering power are fixed to 80
mm, 0.2 Pa, 20 min, 600 ° C and 25 W, respectively. The
microwave performances of the sample were measured by a
vector network analyzer 共Agilent E8363C兲. The power load
was tested by applying dc power on the sample for 96 h. The
details of the testing method of microwave performances and
power load were described in Ref. 7. During the applying dc
power, the surface temperature and the dc resistance of the
sample were measured. The measurement of the temperature
coefficient of resistance 共TCR兲of the resistors was described
in our previous works.8
Figure 4illustrates the photograph of the prepared
MPTFR. The results of the measurement compared with the
simulated performances are presented in Fig. 5. It can be
seen that the VSWR of the sample is lower than 1.6 across
the band of 3.4–7.4 GHz and 8.2–9.8 GHz. The minimal
VSWR is achieved at 5.8 GHz. The agreement between the
experiments and simulation is excellent. The slight differ-
ence between the measurement and the simulation can be
explained by the transition microstrip–subminiature version
A connector, which was not taken into account in the simu-
lation.
Figure 6presents experimental results of the surface
temperature and the dc resistance of the sample when it was
applied 200 W dc power. The power load experiments show
that the surface temperature of the MPTFR can be main-
tained at about 105 °C for 96 h under this power. The dc
resistance of the MPTFR can be maintained at about 25 ⍀
during this power load applying. The change in the resistance
of the sample 共⌬R/R兲is less than 1% during the power load
testing. The power density of the sample is about
10.5 W/mm2. These results indicate that the power load of
the MPTFRs is about 200 W. The TCR of the sample is about
50 ppm/°C.
In summary, we present a MPTFR based on power di-
viding technique. This MPTFR can double the power load of
the device but remain the operating frequency unchanged,
FIG. 3. Dependences of the impedance of the MPTFR on the frequency
simulated by HFSS.
FIG. 4. 共Color online兲Photograph of the prepared MPTFR.
FIG. 5. Experimental and simulated VSWR of the MPTFR.
FIG. 6. Experimental results of the surface temperature and the resistance of
the MPTFR.
FIG. 2. Dependences of VSWR and S11 of the MPTFR on the frequency
simulated by HFSS.
173504-2 Jiang et al. Appl. Phys. Lett. 97, 173504 共2010兲
Downloaded 03 Oct 2013 to 125.39.171.194. This article is copyrighted as indicated in the abstract. Reuse of AIP content is subject to the terms at: http://apl.aip.org/about/rights_and_permissions
which provides a strategy to overcome the limitation that the
operating frequency and the power load cannot be improved
simultaneously in the single resistive film MPTFRs.
The authors would like to acknowledge the financial
support of the Supporting Project of Sichuan 共Grant No.
2010GZ0156兲and Foundation of State Key Laboratory of
Electronic Thin Films and Integrated Devices 共Grant No.
KFJJ200804兲.
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