Article

Formation of silver islands on Langmuir-Blodgett films as investigated by X-ray reflectometry

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Abstract

Silver overlayers on Langmuir-Blodgett multilayers of cadmium arachidate (CdA), a substituted polyglutamate (PG), and a polymeric phthalocyanine derivative (PCPS) were studied by X-ray reflectometry. From fits to the measured reflectivity curves electron density profiles are obtained for the films with and without silver overlayers. The initial sticking ratios of silver on CdA, PG, and PCPS are 0.37, 0.72, and 0.93, respectively. The deposited silver forms islands on top of the multilayers with a maximum penetration depth into the LB films of one to two monolayers only depending on the material of the film.

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... Particle deposition processes are often studied using indirect experimental methods such as ellipsometry and reflectometry (Reiter et al. 1992), total internal reflection fluorescence (Bharill et al. 2011), UV-Vis surface plasmon adsorption (Bar et al. 1996), atomic force microscopy (AFM) (Yang et al. 2007), scanning electron microscopy (SEM), or quartz crystal microgravimetry (QCM) (Bandyopadhyay et al. 1997). However, a disadvantage of these methods is that they become only sensitive for higher coverage, preferably close to the saturation coverage, and often work under ex situ, dry conditions. ...
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... In this way, monolayers of controlled coverage and homogeneity can be produced by adjusting the suspension concentration, pH, ionic strength, and the deposition time (Brouwer et al. 2003; Kleimann et al. 2006; Oc´wiejaOc´wieja et al. 2011, 2012a). However, in these works indirect ex situ methods of particle monolayer characteristics such as UV–Vis surface plasmon adsorption (Bar et al. 1996), atomic force microscopy (AFM) (Yang et al. 2007 ), scanning electron microscopy (SEM), quartz crystal microgravimetry (QCM) (Bandyopadhyay et al. 1997 ), ellipsometry and reflectometry (Reiter et al. 1992) were used. Therefore, the main goal of this work is to develop an efficient method for the in situ characterization of silver particle monolayers on solid substrates based on the streaming potential measurements. ...
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... X-ray reflectivity (XRR) measurements are very useful to study the structure of thin films (down to monomolecular layers). This technique has been widely used for the characterization of Langmuir-Blodgett (LB) monolayers at the air-water interface [33], and LB and LbL films deposited at a solid surface [34,35]. Recently XRR has been also proposed for the characterization at the solid-liquid interface giving the possibility to characterize the structure and function of nanoscale films with biomolecules that have never been exposed to the air [28]. ...
Chapter
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