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Reversible plasma switching in epitaxial BiFeO3 thin films

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Reversible plasma switching in epitaxial multiferroic BiFeO3 thin films was directly observed and analyzed using piezoresponse force microscopy. The polarization could be reversibly switched using oxygen plasma and a subsequent thermal annealing treatment in vacuum, respectively. The domain wall velocity during plasma switching, estimated to about 10-8 m/s, is much slower compared to the normal electrical switching, however a large area of square centimeter scale could be stably switched. The results demonstrate that reversible plasma switching can be achieved by oxygen plasma treatment and it can be a useful tool for an electrode-less control of ferroelectric switching on large area.
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Reversible plasma switching in epitaxial BiFeO
3
thin films
Yunseok Kim,
a
Ionela Vrejoiu, Dietrich Hesse, and Marin Alexe
Max Planck Institute of Microstructure Physics, D-06120 Halle (Saale), Germany
Received 16 April 2010; accepted 27 April 2010; published online 17 May 2010
Reversible plasma switching in epitaxial multiferroic BiFeO
3
thin films was directly observed and
analyzed using piezoresponse force microscopy. The polarization could be reversibly switched using
oxygen plasma and a subsequent thermal annealing treatment in vacuum, respectively. The domain
wall velocity during plasma switching, estimated to about 10
−8
m/ s, is much slower compared to
the normal electrical switching, however a large area of square centimeter scale could be stably
switched. The results demonstrate that reversible plasma switching can be achieved by oxygen
plasma treatment and it can be a useful tool for an electrode-less control of ferroelectric switching
on large area. © 2010 American Institute of Physics. doi:10.1063/1.3431585
Ferroelectric/multiferroic materials are attractive due to
their unique physical properties and wide applications.
1,2
Es-
pecially, magnetoelectric multiferroic materials have recently
been under focus due to possible coupling of ferroelectric
and magnetic properties. Ferroelectric materials have a spon-
taneous polarization with at least two stable orientations,
which usually can be switched by an external electric field.
The polarization bound charges on the as-deposited surfaces
are screened by external and/or internal charges to reduce the
energy of the depolarizing field.
3
When there are insufficient
charges to compensate the polarization bound charges, the
energy of the depolarizing field can be minimized by domain
formation.
46
The particular as-deposited domain structure
depends strongly on the screening of the polarization bound
charges and thus on the particular details of the fabrication
process. However, a monodomain state is preferable to opti-
mize the functional performance of ferroelectric thin films in
applications such as data storage, pyroelectric detectors, or
piezoelectric transducers and actuators. Therefore, tech-
niques to manipulate domain states are important for such
applications. By using conventional switching by an external
electric field it is difficult to switch the films on a centimeter
scale since temporary electrodes are required.
Recently, there have been several reports on ferroelectric
domain states manipulated by external environment.
610
Fong et al.
7
reported that the equilibrium structure of an
epitaxial PbTiO
3
PTO film in an oxidizing environment is a
monodomain state with upward polarization. On the basis of
these results, they also showed that an oxygen partial pres-
sure allows to control the reversible polarization switching in
the PTO thin films.
8
On the other hand, Takahashi et al.
6
reported that photochemical treatment induces switching into
a monodomain state, which could be reversed upon subse-
quent heat-treatment, in PTO thin films. Alternatively, corona
switching can be effectively applied to the polarization
switching of PbZr , TiO
3
and polyvinylidene fluoride-co-
trifluoroethylene thin films.
9,10
However, there are still no
studies on environmental switching in multiferroic thin films,
in particular no direct observations of environmental switch-
ing in ferroelectric/multiferroic thin films.
Here we show direct observations of a reversible switch-
ing process assisted by oxygen plasma treatment in epitaxial
multiferroic BiFeO
3
BFO thin films, using piezoresponse
force microscopy PFM. Oxygen plasma treatment is com-
monly applied to ferroelectric materials for the surface modi-
fication or the improvement of surface properties.
11,12
In the
present work, the oxygen plasma was used as a tool to in-
duce the polarization switching of multiferroic BFO thin
films at room temperature.
Epitaxial BFO thin films with thicknesses of 30 to 170
nm were deposited by pulsed laser deposition PLD on a
PLD-grown SrRuO
3
bottom electrode on top of DyScO
3
110 substrates. The BFO films were deposited at a substrate
temperature of 650 °C, in 0.14 mbar O
2
. PFM measurements
were performed with an ac voltage of 0.41.0 V
rms
at 25
kHz under ambient conditions using a commercial atomic
force microscope XE-100, Park Systems, combined with a
lock-in amplifier SR830, Stanford Research Systems. PtIr
5
coated silicon cantilevers ATEC-EFM, Nanosensors with a
spring constant of 2.8 N/m and a resonance frequency of
75 kHz and Pt/Ti coated silicon cantilevers NSC14/Ti-Pt,
MikroMasch with a spring constant of 5.0 N/m and a reso-
nance frequency of 160 kHz were used for the switching
processes as well as the local PFM measurements. Oxygen
plasma treatments were performed using a commercial
plasma system 100-E, Technics Plasma GmbH at a pressure
of 1 Torr and a rf power of 100 W, for different treatment
durations. To obtain the fraction of the area with upward
polarization, PFM phase images were analyzed over areas of
5 5
m
2
. For the box patterns, background poling was
performed over areas of 6 6
m
2
under a bias of 5V
applied to the conductive probe, followed by poling a small
box pattern over an area of 2 2
m
2
under a bias of +5 V
applied to the conductive probe.
Figure 1 shows PFM phase images as a function of oxy-
gen plasma treatment time for the 30-nm-thick BFO thin
film. The as-deposited domain structure of Fig. 1a is char-
acterized by a needle shape of upward polarized domains,
which might originate in insufficiently screened positive
charges on the multiferroic surface.
46
After plasma treat-
ment for 1 min, the domain structure starts to change into
more granular shaped domains of upward polarization, and
the portion of upward polarization also increases with re-
spect to the pristine state. Further increasing the plasma treat-
a
Author to whom correspondence should be addressed. Electronic mail:
ykim@mpi-halle.mpg.de.
APPLIED PHYSICS LETTERS 96, 202902 2010
0003-6951/2010/9620/202902/3/$30.00 © 2010 American Institute of Physics96, 202902-1
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ment time, the portion of upward polarization increases and
then saturates as shown in Figs. 1 and 2. After treatment for
10 min, about 80% of the measured area was switched into
the upward polarization. A large area up to 1 cm
2
could be
switched using plasma treatment, and this switched region
was stable even after several days under ambient conditions.
This indicates the strong influence of the oxygen plasma
treatment on the BFO thin films. As previously reported,
8
an
oxygen atmosphere induces a chemical switching inside
ferroelectric thin films because its chemical potential pro-
duces an electric field across the film. The chemical potential
of the oxygen atmosphere or the oxidation of the ferroelec-
tric may switch the polarization direction. In the present
case, the oxygen plasma treatment might generate an atmo-
sphere similar to the oxygen atmosphere of Ref. 8. In addi-
tion to the chemical switching, an electric field perpendicular
to the sample surface can be generated during the oxygen
plasma treatment that can be similar to the corona
switching.
9,10
These two reasons might be responsible for the
plasma switching of our BFO epitaxial films.
From the PFM phase images of Fig. 1, we could analyze
the domain growth process during the plasma switching as
schematically presented in Fig. 2b. The switching behavior
is similar to a normal electrical switching in ferroelectric/
multiferroic thin films. Pre-existing upward polarized do-
mains of the as-deposited state can act as nuclei for the elec-
trical switching process. When the sample is oxygen plasma
treated on the as-deposited BFO film surface, the domain
growth starts from these pre-existing upward polarized do-
mains as shown in Fig. 1b and diagram 2 of Fig. 2b.
Afterwards domains grow laterally and coalesce with each
other as shown in Figs. 1c and 1d and diagrams 3 and 4
of Fig. 2b.
The average domain wall velocity could be obtained
from the domain growth behavior before the coalescence
of all domains. At the beginning of domain growth the
domain wall velocity has a maximum value and then de-
creases gradually during the growth process. This behavior is
similar to the domain wall velocity of normal electrical
switching.
13,14
The average domain wall velocity was 1.16
10
−8
m/ s, which is three orders of magnitude slower than
the electrical domain wall velocity of the BFO thin films.
15
Although the domain wall movement was very slow, the
oxygen plasma treatment offers easy switching for a large
area of the materials, which can be larger than several square
centimeters.
The polarization can be switched back to its original
downward state by thermal annealing.
6,8
According to Wang
et al.
8
this is achieved by surface reconstruction during the
annealing procedure, which can occur by ordering of oxygen
vacancies, finally inducing polarization switching to the
downward polarization. A similar situation of the oxygen va-
cancies can be achieved by vacuum annealing, which re-
leases oxygen from the sample surface.
16
To confirm that this
is valid also for epitaxial BFO films, and that the plasma
switching is reversible, the oxygen plasma-treated BFO films
were thermally annealed in vacuum 10
−5
mbar at 350 ° C
for 30 min. After this treatment the domain structure was
recovered to the original state, as presented in Fig. 3c. The
reduction condition of the thermal treatment in vacuum most
likely generates oxygen vacancies in the vicinity of the film
surface, which can induce the back-switching of the polar-
ization. Interestingly, after the thermal treatment, the upward
polarized domains have a needle shape, which indicates that
the pristine upward polarized regions prefer to be back to the
original upward polarized state. This reversible plasma
switching can also be observed for much thicker BFO films
of 60 nm thickness as shown in Figs. 3d3f. This means
that the electric field, generated by oxygen plasma treatment
across the film, is sufficient to switch BFO thin films of at
least several tens of nanometer thickness. However, when the
oxygen plasma treatment and the subsequent thermal treat-
ment in vacuum were repeated, the domain wall velocity
became slower than before, for the same duration of the oxy-
gen plasma process. In the present work, we could not pre-
cisely control the surface oxidation and the density of surface
oxygen vacancies. Repeated runs might lead to changes in
the surface state, which can affect the domain wall motion.
FIG. 1. Color online PFM phase images of a as-deposited and 关共bd兲兴
oxygen plasma treated states for b 1 min, c 4 min, and d 10 min,
respectively, in 30-nm-thick BFO thin films. The scale bar corresponds to
400 nm.
FIG. 2. Color online兲共a Dependence of the area of upward polarized
domains on the duration of treatment by the oxygen plasma. b Schematics
of cross-sectional domain structures in 1 as-deposited and 关共24兲兴 oxygen
plasma treated states for 2 1 min, 3 4 min, and 4 10 min.
202902-2 Kim et al. Appl. Phys. Lett. 96, 202902 2010
Downloaded 17 May 2010 to 192.108.69.177. Redistribution subject to AIP license or copyright; see http://apl.aip.org/apl/copyright.jsp
Therefore, further investigations are needed to optimize the
treatment by oxygen plasma and the subsequent thermal
treatment in vacuum.
The oxygen plasma effect was also examined on the box
patterned prepoled area as shown in Fig. 4. The plasma
switching could be observed even at 170-nm-thick BFO
films. After 1 min oxygen plasma treatment, the polarization
reversal started immediately at the pristine upward polarized
regions inside of the box pattern, incompletely switched
regions lower part of the box pattern, and/or the domain
boundaries. The pristine upward polarized regions might be
related to different local defect states or different distribu-
tions of the screening charges, which render the upward po-
larization more stable than the downward polarization, and
the nonpenetrating domains of incomplete switching are un-
stable compared to the fully switched domains.
17
After the
polarization reversal at these areas, the domain wall laterally
moved from the switched regions, which is similar to the
previous case.
In summary, reversible plasma switching in epitaxial
BFO films was directly observed and investigated using
PFM. 30 to 170-nm-thick BFO films could be switched to
upward polarization using oxygen plasma treatment. The do-
main wall velocity was much slower compared to the normal
electrical switching, however a large area of centimeter scale
could be stably switched. The switched regions could be re-
covered to the original state of the downward polarization
using a thermal treatment in vacuum. The results show that
reversible plasma switching can be achieved by oxygen
plasma treatment. This method can be a useful tool to control
the switching behavior for a large area of multiferroic
samples.
The first author Y.K. acknowledges the financial sup-
port of the Alexander von Humboldt Foundation.
1
J. F. Scott and C. A. Araujo, Science 246 , 1400 1989.
2
J. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D.
Viehland, V. Vaithyanathan, D. G. Scholm, U. V. Waghmare, N. A.
Spaldin, K. M. Rabe, M. Wuttig, and R. Ramesh, Science 299, 1719
2003.
3
S. V. Kalinin and D. A. Bonnell, Phys. Rev. B 63, 125411 2001.
4
S. K. Streiffer, J. A. Eastman, D. D. Fong, C. Thompson, A. Munkholm,
M. V. R. Murty, O. Auciello, G. R. Bai, and G. B. Stephenson, Phys. Rev.
Lett. 89, 067601 2002.
5
B.-K. Lai, I. Ponomareva, I. I. Naumov, I. Kornev, H. Fu, L. Bellaiche,
and G. J. Salamo, Phys. Rev. Lett. 96, 137602 2006.
6
R. Takahashi, J. K. Grepstad, T. Tybell, and Y. Matsumoto, Appl. Phys.
Lett. 92, 112901 2008.
7
D. D. Fong, A. M. Kolpak, J. A. Eastman, S. K. Streiffer, P. H. Fuoss, G.
B. Stephenson, C. Thompson, D. M. Kim, K. J. Choi, C. B. Eom, I.
Grinberg, and A. M. Rappe, Phys. Rev. Lett. 96, 127601 2006.
8
R. V. Wang, D. D. Fong, F. Jiang, M. J. Highland, P. H. Fuoss, C. Thomp-
son, A. M. Kolpak, J. A. Eastman, S. K. Streiffer, A. M. Rappe, and G. B.
Stephenson, Phys. Rev. Lett. 102, 047601 2009.
9
C. A. Nguyen, P. S. Lee, W. A. Yee, X. Lu, M. Srinivasan, and S. G.
Mhaisalkar, J. Electrochem. Soc. 154, G224 2007.
10
J. M. Marshall, Q. Zhang, and R. W. Whatmore, Thin Solid Films 516,
4679 2008.
11
Y. Park, Y. K. Lee, I. Chung, and J.-Y. Lee, Jpn. J. Appl. Phys. 38, L577
1999.
12
H. K. Jang, S. K. Lee, C. E. Lee, S. J. Noh, and W. I. Lee, Appl. Phys.
Lett. 76, 882 2000.
13
B. J. Rodriguez, R. J. Nemanich, A. Kingon, A. Gruverman, S. V. Kalinin,
K. Terabe, X. Y. Lia, and K. Kitamura, Appl. Phys. Lett. 86, 012906
2005.
14
A. Gruverman, D. Wu, and J. F. Scott, Phys. Rev. Lett. 100, 097601
2008.
15
Y. C. Chen, Q. R. Lin, and Y. H. Chu, Appl. Phys. Lett. 94, 122908
2009.
16
Y. Kim, M. Alexe, and E. K. H. Salje, Appl. Phys. Lett. 96, 032904
2010.
17
J. Woo, S. Hong, D. K. Kim, H. Shin, and K. No, Appl. Phys. Lett. 80,
4000 2002.
FIG. 3. Color online PFM phase images of different states: 关共a and d兲兴
as-deposited, 关共b and e兲兴 oxygen plasma treated for 10 min, and 关共c and
f兲兴 after subsequent annealing at 350 °C for 30 min, for BFO thin films of
关共ac兲兴 30 nm and 关共df兲兴 60 nm thickness. The scale bars of c and f
correspond to 400 nm and 300 nm, respectively.
FIG. 4. Color online PFM phase images of the box patterns on the a
pristine and 关共b and c兲兴 oxygen plasma treated states for b 1 min and c
12 min, in 170-nm-thick BFO thin film. The blue dashed lines indicate the
location of the downward polarized box pattern. The scale bar corresponds
to 600 nm.
202902-3 Kim et al. Appl. Phys. Lett. 96, 202902 2010
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... In addition to the application of the electric field, environmental conditions can induce domain switching [27][28][29] because the surface state of ferroelectric materials is sensitive to environmental conditions. Among them, an oxygen atmosphere induces chemical switching inside ferroelectric thin films 29) because its chemical potential produces an electric field across the film. ...
... In a similar manner, the oxidation of ferroelectric surfaces can switch the polarization direction. 27) In Fig. 2(a)(i), the as-prepared domain structures in the BiFeO 3 (BFO) thin film show a downward matrix domain with upward needle-like domains. However, after 10 min of oxygen plasma treatment, the downward area was significantly increased compared to that of the as-prepared state, as shown in Fig. 2(a)(ii). ...
... This chemically induced changes in ferroelectric domain structures was observed using SPM. Publishing LLC [383]. ...
... Reversible chemical switching was also reported in BiFeO3 (BFO) thin films using PFM. [383] The oxygen plasma and vacuum thermal annealing were used to chemically control the polarization switching as similar to atmospheres with high and low oxygen partial pressures, respectively, in ref. [134] As shown in figure VI.1, reversible chemical switching was well achieved by surface chemical reactions by the oxygen plasma and subsequent vacuum thermal annealing. They further directly observed that the later domain growth during the plasma treatment depends on the duration of the treatment. ...
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