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Publications
Publications (61)
![Topology of second-order filters in PSoC1 [8]](publication/367297436/figure/fig2/AS:11431281158292915@1684115334374/Topology-of-second-order-filters-in-PSoC1-8_Q320.jpg)
This paper presents a scheme to diagnose soft faults in switched-capacitor (SC) filters embedded in the PSoC1 processor from Infineon. The work addresses faults that cause reductions in the values of the filter capacitors due to degradations produced by electrical stress. The diagnosis scheme employs the step response of the pass band output of the...
This work introduced a new BIST scheme under a functional test approach. It solves the problem of determining in-field the specifications of lowpass filters embedded in PSoC1 devices with zero hardware overhead. The user can implement the BIST we propose here because it just requires the information and resources freely offered by the manufacturer,...
In this work, we address a low-cost test of switched capacitors filters embedded in configurable analog sections. The proposal improves the Transient Analysis Method (TRAM) by incorporating a similarity measure, dynamic time warping. In this way, we extend TRAM to cases that that initially were not compatible and simplify the test of filters of ord...
En el presente trabajo, se analiza la capacidad del algoritmo Optimización por Enjambre de Partículas para diseñar filtros analógicos de capacidades conmutadas embebidos en una plataforma deseñales mixtas para una amplia variedad de especificaciones. Se utiliza la tasa de convergencia para medir el rendimiento del optimizador en estos distintos esc...
Este trabajo presenta una propuesta de test funcional para filtros de capacidades conmutadas pasabanda implementados sobre hardware configurable analógico de sistemas en chip de señales mixtas, basado en análisis de respuesta transitorio. El esquema propuesto incorpora la generación de estímulos dentro del mismo chip bajo test, reduciendo el instru...
This work introduces a low-cost test strategy for second-order lowpass filters implemented in analog reconfigurable circuits of PSoC1 devices. By adopting a functional approach, the specifications of the filters are determined through the analysis of their transient response features. The strategy relies on the device dynamic reconfiguration abilit...
En este trabajo se presenta una estrategia de test basada en análisis de respuesta transitoria para filtros analógicos de capacidades conmutadas embebidos en dispositivos PSoC1 de Cypress® Semiconductor. La propuesta es de bajo costo y puede ser usada para mantenimiento en campo. La solución de test consiste en establecer bloques reconfigurables an...
En este trabajo se aplica el método Optimización por Enjambre de Partículas para el diseño de filtros analógicos de capacidades conmutadas embebidos en la plataforma configurable de señales mixtas PSoC1 de Cypress Semiconductor. Se realiza una evaluación intensiva del algoritmo para un amplio rango de filtros. Los resultados obtenidos muestran que...
This work presents a design methodology for discrete active RC biquadratic filters based on genetic algorithm (GA). The main difference with other methods is the consideration of the passive sensitivities during the optimization process. The GA delivers the values of resistors and capacitors (from E series) that comply with the desired specificatio...
Se observa que un número importante de errores transitorios y permanentes afectan la operación de sistemas electrónicos en ambientes radioactivos. En particular, el Quemado por Evento Único (Single Event Burnout, SEB) es un fenómeno iniciado por la interacción de iones pesados con ciertos dispositivos electrónicos. La carga depositada por el ión de...
In this work the capability of TRAM (Transient Response Analysis Method) for detecting out-of-specification circuits is evaluated. With this purpose we adopt a behavioral point of view, defining a fault as the non compliment of any of the specifications. Although this approach has been previously addressed by many authors, this paper focuses on the...
This paper evaluates the capacity of the test strategy named Transient Response Analysis Method (TRAM) to detect manufactured circuits that fall inside or outside its specifications. With this purpose, a behavioral level approach is adopted, defining a fault as the inability to comply with any of the specifications. Although this strategy has been...
This paper presents a study related to thermal and mechanical behavior of power DMOS transistors during a Single Event Burnout (SEB) process. We use a cylindrical heat generation region for emulating the thermal and mechanical phenomena related to the SEB. In this way, it is avoided the complexity of the mathematical treatment of the ion-device int...
The ability of TRAM for detecting parametric faults in a second-order filter selected as a case of study is studied in this work. Particularly, we adopt a low-pass Sallen-Key filter synthesized on a 500nm CMOS technology. We perform the design using diffused resistors, poly-poly capacitors and a full-custom operational amplifier. For fault injectio...
This paper explores the feasibility of an adaptive scheme to tolerate degradations in a high- order low- pass filter, taken as a case study. The adaptation is achieved through an evolvable hardware strategy that employs reconfigurable hardware and a genetic algorithm (GA). For establishing the filter reconfiguration, it is considered that it is tes...
This work presents the evaluation of the ability of the so called Transient Analysis Method (TRAM) for detecting parametric faults in the passive components of a second-order active filter. We perform evaluation similar to the previously reported but using a considerably more detailed simulation model. A particular technology is targeted for the fi...
work addresses the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit (EACC), composed of operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family. This test strategy is particularly useful for in-field application requiring reliability,...
This work addresses the application of the analog configurability test (ACT) approach for an embedded analog configurable circuit (EACC), composed of operational amplifiers and interconnection resources that are embedded in the MSP430xG461x microcontrollers family. This test strategy is particularly useful for in-field application requiring reliabi...
This work evaluates the ability of OBT for detecting parametric faults in continuous-time filters. To this end, we adopt two filters with quite different topologies as cases of study and a previously reported statistical fault model. In addition, we explore the behavior of the test schemes when a particular test condition is changed. The new data r...
Palabras Clave: Quemado por evento único, Método de Elementos Finitos, termoelasticidad, transistores de potencia. Resumen. Los componentes electrónicos que forman parte de equipos y sistemas que funcionan en ambientes radioactivos o en entornos de partículas cargadas pueden resultar afectados por el fenómeno conocido como Quemado por Evento Único,...
This paper proposes a self-test strategy, analog configurability test (ACT), for an embedded analog configurable circuit (EACC) composed of operational amplifiers and interconnection resources that are present in the MSP430 microcontroller family from Texas Instruments®. The ACT strategy minimizes the cost in hardware overhead by employing only the...
This paper presents an adaptive amplifier that is part of a sensor node in a wireless sensor network. The system presents a target gain that has to be maintained without direct human intervention despite the presence of faults. In addition, its bandwidth must be as large as possible. The system is composed of a software-based built-in self-test sch...
Palabras Clave: Evento único, transferencia de calor, semiconductores, elementos finitos. Resumen. En este trabajo se aborda el problema de modelar y simular el fenómeno de conducción térmica en tres dimensiones desplazando la fuente de calor hacia los bordes de la celda del transistor. Se logra de esta forma evaluar la capacidad de predicción de l...
In this paper, we analyze the thermomechanical effects occurring in a power DMOS transistor after a single-event burnout process. This paper focuses on simulation to determine a safe time at which the device should be disconnected from the power supply to prevent damage. This strategy has been proposed as a means to avoid dangerous values in the te...
We evaluate the ability of transient response analysis method (TRAM), a simple test strategy proposed for filters, to detect deviations in circuit specifications beyond established limits. Particularly, we focus our attention on deviations produced by displacement damage in integrated resistors. This damage is produced by the impact of high-energy...
In this work, we evaluate the ability of the transient response analysis method (TRAM), a low cost off-line test strategy proposed for filters to detect deviations in circuit specifications beyond established limits. For this assessment, we adopt as case study a benchmark second-order filter and formulate a deviation-fault model that take into cons...
This paper studies the effect of Analog Single-Event Transients (ASETs) in OTA-C struc tures. By adopting an ASET model previously reported and fully compatible with SPICE de scriptions, a simulation campaign is carried out in an OTA-C low-pass filter taken as a case study. The results of this campaign show that the structure of the circuit under s...
This paper studies the effect of Analog Single-Event Transients (ASETs) in OTA-C struc-tures. By adopting an ASET model previously reported and fully compatible with SPICE de-scriptions, a simulation campaign is carried out in an OTA-C low-pass filter taken as a case study. The results of this campaign show that the structure of the circuit under s...
In this work, we explore the ability of OBT for testing OTA-C filters with a more complex OTA configuration than in previously reported one. Adopting a second-order structure as a case study, we use a non-linear block in the feedback loop in order to force the oscillations. The evaluation of the test quality is made by fault simulation. The simulat...
This paper proposes the use evolvable hardware (EHW) for providing fault tolerance to an amplifier system in a signal-conditioning environment. The system has to maintain a given gain despite the presence of faults, without direct human intervention. The hardware setup includes a reconfigurable system on chip device and an external computer where a...
This work analyzes the thermal and mechanical effects arising in a power Diffusion Metal Oxide Semiconductor (DMOS) during a Single Event Burnout (SEB) process. For studying these effects we propose a more detailed simulation structure than the previously used by other authors, solving the mathematical models by means of the Finite Element Method....
This paper proposes a new performance characterization for oscillation-based test (OBT). The ability of OBT for detecting deviation faults under simultaneous statistical fluctuation of the non-faulty parameters is evaluated. For this purpose, we use Monte Carlo simulations and a fault model that considers as faulty only one component of the filter...
In this work, we explore the ability of oscillation-based test (OBT) for testing OTA-C filters. Adopting a second-order band pass filter as a case study, we present a scheme that uses a non linear characteristic in the feedback loop. The effectiveness of the strategy is qualified by means of fault simulation.
Entre los fenómenos que afectan a los dispositivos electrónicos o circuitos integrados que operan en ambientes radioactivos o de partículas cargadas se destacan los conocidos como Efectos de Eventos´Unicos (SEE, Single Event Effect), y en particular el conocido como Quemado Por Eventó Unico (SEB, Single Event Burnout), que se produce por la interac...
In this paper, we propose a novel low-cost BIST scheme for testing low-pass FIR and IIR filters, based on the oscillation-based test (OBT). The OBT–BIST scheme developed here avoids test-pattern generation and tests the filter at-speed, without test-point insertion. We employ a systematic procedure for designing the oscillator and for obtaining the...
This paper proposes a new performance characterization for the test strategy intended for second order filters denominated Transient Analysis Method (TRAM). We evaluate the ability of the addressed test strategy for detecting deviation faults under simultaneous statistical fluctuation of the non-faulty parameters. For this purpose, we use Monte Car...
This paper analyzes the use of the oscillation-based test (OBT) to test high-order continuous-time ladder filters. The OBT implementation requires converting the filter under test into a non-linear oscillator. The prediction of the oscillation parameters (frequency and amplitude) is done using a combination of analytical and graphical methods, resu...
This paper proposes the test of high-order switched-capacitor (SC) ladder filters by means of the oscillation-based test (OBT).
The OBT implementation requires converting the filter under test into a non-linear oscillator and the study of different oscillation
modes in order to evaluate their convenience for testing purposes. The prediction of the...
This paper analyzes the use of the oscillation-based test (OBT) to test high-order continuous-time ladder filters. The OBT implementation requires converting the filter under test into a non-linear oscillator. The prediction of the oscillation parameters (frequency and amplitude) is done using a combination of analytical and graphical methods, resu...
This paper proposes a new operational amplifier model for evaluating test strategies at behavioural level. Major modifications on a previously reported model for improving its performance and for allowing reliable fault simulations are presented here. The new model presents a set of very appealing characteristics for behavioural-level fault injecti...
In this work, the ability of the test strategy named Transient Analysis Method for detecting parametric faults is evaluated. These faults are defined as violations in the circuit specifications due to statistical deviations in the components. Consequently, a circuit is declared as faulty if at least one of the specifications is beyond the tolerable...
We address the problem of testing digital shapers used for nuclear spectroscopy. Particularly, we propose a solution based on the oscillation-based test (OBT) for testing the finite impulse response (FIR) filters of the shaper. The OBT strategy developed here exploits the natural partition of the system in high-pass and low-pass sections for implem...
En este trabajo se evalúa la capacidad de la estrategia de test denominada Método de Análisis de Transitorio para la detección de fallas paramétricas . Estas fallas son definidas como violaciones en las especificaciones de un circuito debido a desviaciones estadísticas en los componentes. Consecuentemente, el circuito es declarado como defectuoso s...
This paper addresses the problem of testing continuous-time nuclear-pulse shapers using Oscillation-Based Test (OBT). The proposal is to convert the whole systems into non-linear oscillators, avoiding the partition in low-order sections. The de-sign of the oscillators is very simple because the non-linear elements are mathematically modeled using t...
In this work, we present an exploratory study on the ability of oscillation-based test (OBT) for testing continuous-time low-pass ladder filters. Particularly, fifth and seventh order Butterworth and elliptic filters are addressed. We devote our effort in determining the efficiency of OBT for detecting deviation-faults in the filters components, us...
The test of high-order switched-capacitors (SC) ladder filters by means of the oscillation-based test (OBT) is presented in this work. Particularly, we addressed the problem of testing 5th and 7 th order low-pass Butterworth and elliptic filters. We focused our attention on the ability of OBT for detecting deviation-faults in the capacitors present...
In this paper, a way to test switched-capacitors ladder filters by means of Oscillation-Based Test (OBT) methodology is proposed. Third-order low-pass Butterworth and Elliptic filters are considered in order to prove the feasibility of the proposed approach. A topology with a non-linear element in an additional feedback loop is employed for convert...
A new operational amplifier model for evaluating test strategies at behavioral level is proposed. It presents a set of very appealing characteristics for behavioral-level fault injection and simulation. The matching between behavioral-level model and transistor-level one is evaluated in order to validate the model. A second hypothetical OPA is mode...
In this paper is proposed as a case study the test of a folded cascode operational amplifier using the Oscillation Test Strategy (OTS). This Operational Amplifier (OPA) is chosen in order to evaluate the ability of OTS to test a more complex amplifier than those previously reported. To obtain comparative results, three different types of single-OPA...
This work presents an off-line Built-In Self-Test for timing
systems based on synchronous BCD counters. We adopt for this case study
a functional approach, exploiting the functional characteristics of the
modules in the system for test pattern generation. Different
alternatives for test sequences, simulation and experimental results are
shown. Faul...
Resumen. El Quemado por Eventó Unico (Single Event Burnout) resulta de la interacción de una partícula cargada proveniente de la radiación espacial con un dispositivo de potencia en estado de no conducción y bloqueando tensiones relativamente altas. Este es uno de los fenómenos de mayor incidencia en la electrónica espacial y que fácilmente puede c...
Palabras clave: test de circuitos analógicos, modelos de falla estadística, test por análisis de respuesta transitoria. Resumen. En el presente trabajo se evalúa la capacidad de la estrategia de test denominada Método de Análisis de Transitorio (TRAM) para detectar fallas en los elementos de un filtro bajo condiciones de variabilidad estadística de...
