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depicts the 1kbyte×8-bit non-imprinting SRAM array and the associated peripheral circuits such as row decoder, column decoder, input buffer, and sense amplifier. The SRAM array is arranged to be 32*32*8-bit architecture. The row decoder and column decoder decodes the 10-bit Address to triggers the word-line, WL to look for the designated SRAM cells in the array. The input buffer accepts the 8-bit Inputs to performs write operation to the designated SRAM cells if the Write signal is triggered. The sense amplifier performs read operation from the designated SRAM cells and amplifies the copied data to generate the 8-bit Outputs if the Read signal is triggered. 

depicts the 1kbyte×8-bit non-imprinting SRAM array and the associated peripheral circuits such as row decoder, column decoder, input buffer, and sense amplifier. The SRAM array is arranged to be 32*32*8-bit architecture. The row decoder and column decoder decodes the 10-bit Address to triggers the word-line, WL to look for the designated SRAM cells in the array. The input buffer accepts the 8-bit Inputs to performs write operation to the designated SRAM cells if the Write signal is triggered. The sense amplifier performs read operation from the designated SRAM cells and amplifies the copied data to generate the 8-bit Outputs if the Read signal is triggered. 

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We propose an dynamic-voltage-scaling (DVS) non-imprinting Master-Slave SRAM with high speed erase, for low power high secured defense applications. There are three key features in the proposed design. First, the stored data is periodically toggling in the SRAM cell to prevent data imprint, hence our design is highly secured against the unauthorize...

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Context 1
... operation to the designated SRAM cells if the Write signal is triggered. The sense amplifier performs read operation from the designated SRAM cells and amplifies the copied data to generate the 8-bit Outputs if the Read signal is triggered. Fig. 4 depicts the non-imprinting SRAM cell, which is used to build the 32*32*8-bit SRAM array (in the Fig. 3). The proposed SRAM comprises a reset circuit, a master circuit, a slave circuit, a clock tree and a read/write circuit. The reset circuit performs the high speed erase operation of the stored data when Rst is triggered. The master circuit inverts the data from S to Q when Clk 2 is triggered. The slave circuit copies the data from Q to ...
Context 2
... buffer, and sense amplifier. The SRAM array is arranged to be 32*32*8-bit architecture. The row decoder and column decoder decodes the 10-bit Address to triggers the word-line, WL to look for the designated SRAM cells in the array. The input buffer accepts the 8-bit Inputs to performs write operation to the designated SRAM cells if the Write signal is triggered. The sense amplifier performs read operation from the designated SRAM cells and amplifies the copied data to generate the 8-bit Outputs if the Read signal is triggered. Fig. 4 depicts the non-imprinting SRAM cell, which is used to build the 32*32*8-bit SRAM array (in the Fig. 3). The proposed SRAM comprises a reset circuit, a master circuit, a slave circuit, a clock tree and a read/write circuit. The reset circuit performs the high speed erase operation of the stored data when Rst is triggered. The master circuit inverts the data from S to Q when Clk 2 is triggered. The slave circuit copies the data from Q to S when Clk 1 is triggered. Clk 1 and Clk 2 are the non-overlapping clocks generated by the Toggling_Clk 1 and Toggling_Clk 2 from the system via a series of clock tree. The clock tree is to maintain the signal strength for high number of fan-outs in the overall 1kbyte×8-bit SRAM ...

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Citations

... However, to feature the non-imprinting and high-speed erase mechanisms, the reported NIHE 22-T SRAM cell [5], [9] occupies a comparatively larger area overhead. The large overhead also leads to high power dissipation (with significant amount of leakage power). ...
... A [9] MT_CLK ST_CLK T_RST ...
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