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(color online) Normalized magnetic torque curves of Fe films deposited on Mg(001) substrate at different deposition angles: (a) 0 • , (b) 45 • , (c) 55 • , and (d) 70 • .
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The uniaxial magnetic anisotropy of obliquely deposited Fe(001)/Pd film on MgO(001) substrate is investigated as a function of deposition angle and film thickness. The values of incidence angle of Fe flux relative to surface normal of the substrate are 0?, 45?, 55?, and 70?, respectively. In-situ low energy electron diffraction is employed to inves...
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... normalized magnetic torque curves for all four samples are shown in Fig. 8. The values of magnetic anisotropy constants K l and K u are determined by fitting the normalized torque curves with Eq. (7). It is obvious that the sample deposited with α = 0 • (normal deposition) shows the minimum value of UMA, K u = 5.0 × 10 3 J/m 3 , with dominant fourfold MCA K l = 5.2 × 10 4 J/m 3 , and with higher deposition ...
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Citations
Bu çalışmada, Si(100)/SiO2(~200 nm) alttaş üzerine 4 - 20 nm arasında değişen kalınlıklarda büyütülen permalloy ince filmlerin yapısal ve manyetik özellikleri araştırılmıştır. Permalloy ince filmler eğik açılı magnetron saçtırma tekniği kullanılarak yüksek vakumlu odada hazırlandı. X-ışını foto-elektron spektroskopisi ölçüm sonuçlarından, permalloyun alaşım komposizyonu oranı %21 Fe ve %79 Ni olarak bulundu. X-ışını kırınım ve yansıma ölçümleri, permalloy filmlerinin (111) yönünde, düşük yüzey pürüzlülüğüne sahip ve nominal kalınlıklarda büyüdüğünü gösterdi. Elde edilen ince filmlerin manyetik özellikleri ferromanyetik rezonans (FMR) ve titreşimli örnek manyetometresi (VSM) teknikleri kullanılarak araştırıldı. Film hazırlamada kullanılan eğik biriktirme nedeniyle, filmlerde düzlem içi tek-eksenli manyetik anizotropi gözlemlendi. Mıknatıslanma yönüne göre serbest enerji minimizasyonu yöntemini kullanan bir bilgisayar kodu yazılarak deneysel FMR verileri simule edildi ve bu sayede filmlerin tek eksenli anizotropi sabitleri belirlendi. Ayrıca, zorlayıcı alan ve anizotropi alanı gibi manyetik özelliklerin kalınlığa bağlı olarak değişimleri tartışıldı.
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