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a shows an X-ray diffraction (XRD) θ-2θ scan of a [BFO 5 /LSMO 20 ] 10 superlattice, where 5 and 20 represent the number of unit cells of BFO and LSMO layers and 10 is the number of bilayer repetitions. Narrow superlattice peaks, as evidenced by seven orders of Kiessig fringes, indicate epitaxial growth of a high quality superlattice. Well-defined interfaces and uniform chemical compositions within individual layers were also confirmed with X-ray reflectivity (XRR) (Figure S1, Supporting Information). Specifically, we obtained a root-meansquare (rms) roughness of 4.0 ± 0.2 Å for the BFO/LSMO interfaces averaged over the coherence of the X-ray beam projected on the sample's surface (≈tens of millimeters). Atomic force microscopy confirmed an atomically flat surface composed of step-and-terrace features with a rms roughness 4.2 ± 0.2 Å (inset of a) over a large area of 3 μm × 3 μm. The superlattice is coherently strained by the STO substrate. c,d shows representative high-angle annular dark-field (HAADF) images of a BFO/LSMO superlattice taken in scanning transmission electron microscopy (STEM) mode. These images show epitaxial growth with chemically sharp and coherent interfaces. [29,30] e shows spatially resolved electron energy-loss spectroscopy (EELS) elemental maps for the Bi-M 4,5 , Fe-L 2,3 , La-M 4,5 , Sr-L 2,3 , and Mn-L 2,3 edges, indicating the chemical uniformity within the individual layer. Chemical sharpness was ascertained using EELS profiling, as shown in

a shows an X-ray diffraction (XRD) θ-2θ scan of a [BFO 5 /LSMO 20 ] 10 superlattice, where 5 and 20 represent the number of unit cells of BFO and LSMO layers and 10 is the number of bilayer repetitions. Narrow superlattice peaks, as evidenced by seven orders of Kiessig fringes, indicate epitaxial growth of a high quality superlattice. Well-defined interfaces and uniform chemical compositions within individual layers were also confirmed with X-ray reflectivity (XRR) (Figure S1, Supporting Information). Specifically, we obtained a root-meansquare (rms) roughness of 4.0 ± 0.2 Å for the BFO/LSMO interfaces averaged over the coherence of the X-ray beam projected on the sample's surface (≈tens of millimeters). Atomic force microscopy confirmed an atomically flat surface composed of step-and-terrace features with a rms roughness 4.2 ± 0.2 Å (inset of a) over a large area of 3 μm × 3 μm. The superlattice is coherently strained by the STO substrate. c,d shows representative high-angle annular dark-field (HAADF) images of a BFO/LSMO superlattice taken in scanning transmission electron microscopy (STEM) mode. These images show epitaxial growth with chemically sharp and coherent interfaces. [29,30] e shows spatially resolved electron energy-loss spectroscopy (EELS) elemental maps for the Bi-M 4,5 , Fe-L 2,3 , La-M 4,5 , Sr-L 2,3 , and Mn-L 2,3 edges, indicating the chemical uniformity within the individual layer. Chemical sharpness was ascertained using EELS profiling, as shown in

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In this work, we obtained a quantitative depth dependent magnetization profile across the planar interfaces in BiFeO3/La0.7Sr0.3MnO3 (BFO/LSMO) superlattices using polarized neutron reflectometry (PNR). We observed an enhanced magnetization of 1.83 ± 0.16 μB/Fe in BFO layers when they are interleaved between two manganite layers. The enhanced magne...

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... Therefore, with the increase of the exchange-coupling J int strength, the remanent and saturation magnetization increases, as shown in Fig. 6a. As a result, [62,63]. Furthermore, it's confirming the reported high magnetization value for BFO on LSMO compared to LSMO (or BFO) alone [64,65]. ...
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