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(a) Raman spectrum around the 2D peak along the y-direction highlighted in Figure 3o (at Va = 50 V). (b) ω2D along the y-direction as shown in Figure 3o (see cross for end point) for different applied potentials Va. The black dashed line indicates the maximum strain gradient. (c) Γ2D shows a strong inhomogeneous broadening at the positions where the strain gradient in panel (b) is maximum. (d) To quantify the strain gradient in the grey shaded area in panels (b) and (c), we convolute a piecewise linear function with width d (arrow) with the laser spot. The fit result gives us a width d of 325 nm, which corresponds to a gradient ∂ω2D/∂y = 117 cm −1 /µm or ∂/∂y = 1.4 %/µm at Va = 50 V. 

(a) Raman spectrum around the 2D peak along the y-direction highlighted in Figure 3o (at Va = 50 V). (b) ω2D along the y-direction as shown in Figure 3o (see cross for end point) for different applied potentials Va. The black dashed line indicates the maximum strain gradient. (c) Γ2D shows a strong inhomogeneous broadening at the positions where the strain gradient in panel (b) is maximum. (d) To quantify the strain gradient in the grey shaded area in panels (b) and (c), we convolute a piecewise linear function with width d (arrow) with the laser spot. The fit result gives us a width d of 325 nm, which corresponds to a gradient ∂ω2D/∂y = 117 cm −1 /µm or ∂/∂y = 1.4 %/µm at Va = 50 V. 

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There are a number of theoretical proposals based on strain engineering of graphene and other two-dimensional materials, however purely mechanical control of strain fields in these systems has remained a major challenge. The two approaches mostly used so far either couple the electrical and mechanical properties of the system simultaneously or intr...

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... pink line shows that the force obtained using the parallel plate approximation for the capacitance is in good agreement with the simulation for displacements up to 10 nm. Please note that 2η = 8.7 ± 0.5 nF/m for these devices, as they had a slightly different design than the devices shown in Supplementary Figure 2 Supplementary Figure 4. Raman pre-characterization. (a) Raman map of the silicon peak area at 521 cm −1 superimposed with a Raman map of the 2D peak area, which has been obtained as follows. ...

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