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(a) Normal direction photodiode response depending on the depression depth. The measurement error was 20 mV. (b) The reaction force in the normal direction added with the friction force, f μ , will balance the lateral force, f Torsion , which results in stable inclination angle, ψ. (c) If the tip is depressed harder, the variation width (half range) of the lateral response swing will increase along with the torsion. (d) Measured half range depending on lateral torsion. The curve is a fit to the measurements. The measurement error was 50 mV.
Source publication
A novel calibration technique has been developed for lateral force microscopy (LFM). Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate is required for LFM calibration. The new calibration technique reported in this paper greatly reduces the required preparation processes by simply scanning over a rigid st...
Contexts in source publication
Context 1
... the normal response found to be close to linear, only deviating from this in the upper scan range by 2% in the scan limit ( figure 1(a)). Torsional pre-calibration, I L−R against torsion δ, is performed by scanning the AFM tip laterally on a silicon dioxide substrate. ...
Context 2
... equations (6) and (7), the maximum torsion was determined to be 0.8 ± 0.1 nm at 5440 nm depression. As expected, the half range of I L−R increased following an increase of the depression depth ( figure 1(d)). The response of the photodiode was linear at small depressions, but it became strongly nonlinear at deep depressions. ...
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The works deals with a study of fillers influence on chosen mechanical properties of polyamide and the given influence was investigated by using of atomic force microscopy (AFM). Atomic force microscope NT-206 in a complex with control and image processing software is intended for measurement and analysis of surface microrelief and submicrorelief,...
Citations
... Due to the large normal load range implemented in the experiment, cantilever torsion and its impact on pixel registry has also been considered. The maximum cantilever torsion based on all factors in this experiment (scan size, tip geometry, normal/lateral force, etc.) is just 1 pixel along each scan direction [32]. This corresponds to a registry error of at most 2 pixels since friction is measured by relating trace (-1 pixel) and retrace (+1 pixel) scans. ...
As mechanical devices in the nano/micro length scale are increasingly
employed, it is crucial to understand nanoscale friction and wear especially at
technically relevant sliding velocities. Accordingly, a novel technique has
been developed for Friction Coefficient Mapping (FCM), leveraging recent
advances in high speed AFM. The technique efficiently acquires friction versus
force curves based on a sequence of images at a single location, each with
incrementally lower loads. As a result, true maps of the coefficient of
friction can be uniquely calculated for heterogeneous surfaces. These
parameters are determined at a scan velocity as fast as 2 mm/s for
microfabricated SiO2 mesas and Au coated pits, yielding results that are
identical to traditional speed measurements despite being ~1000 times faster.
To demonstrate the upper limit of sliding velocity for the custom setup, the
friction properties of mica are reported from 200 {\mu}m/sec up to 2 cm/sec.
While FCM is applicable to any AFM and scanning speed, quantitative
nanotribology investigations of heterogeneous sliding or rolling components are
therefore uniquely possible, even at realistic velocities for devices such as
MEMS, biological implants, or data storage systems.
... Prior to the force measurement, the calibration was performed using an AFM cantilever (ContPt, Nanoworld) in the AFM system (Model Nano-I 2 AFM, Pacific Nanotechnology ). From this calibration, the coefficient was found to be c L = 0.20 ± 0.09 nN/mV [35]. The recorded force (reaction with thermal actuation) is calculated by the following: ...
This paper reports on a polypyrrole (ppy) based bimorph nanoactuator. The nanoactuator consists of ppy nanowire and Cu thin film. To create a nanoactuator, a (10 ± 5)-nm-thick Cu film was precisely deposited on one side of a (13.7 ± 1.0)-μm-long and 270 ± 20 nm diameter ppy nanowire. The bimorph was thermally actuated using the mismatch of the coefficients of thermal expansion (CTEs) between Cu and ppy. The CTE of ppy nanowire was obtained by measuring the deflection of the bimorph. The measured CTE of ppy was (12 ± 1 × 10<sup>-6</sup>)/K, which was found to be much less than CTE of a typical polymer. Further, the amount of the force generated by the ppy/Cu bimorph was measured by lateral force microscopy (LFM). The measured force from the nanoactuator was approximately 1 nN at ΔT = 100 K.
We are exploring nanoelectronic engineering areas based on low dimensional materials, including carbon nanotubes and graphene. Our primary research focus is investigating carbon nanotube and graphene architectures for field emission applications, energy harvesting and sensing. In a second effort, we are developing a high-throughput desktop nanolithography process. Lastly, we are studying nanomechanical actuators and associated nanoscale measurement techniques for re-configurable arrayed nanostructures with applications in antennas, remote detectors and biomedical nanorobots. The devices we fabricate, assemble, manipulate and characterize potentially have a wide range of applications including sensors, detectors, system-on-a-chip, system-in-a-package, programmable logic controls, energy storage systems and all-electronic systems.
We are exploring nanoelectronic engineering areas based on low dimensional materials, including carbon nanotubes and graphene. Our primary research focus is investigating carbon nanotube and graphene architectures for field emission applications, energy harvesting and sensing. In a second effort, we are developing a high-throughput desktop nanolithography process. Lastly, we are studying nanomechanical actuators and associated nanoscale measurement techniques for re-configurable arrayed nanostructures with applications in antennas, remote detectors, and biomedical nanorobots. The devices we fabricate, assemble, manipulate, and characterize potentially have a wide range of applications including those that emerge as sensors, detectors, system-on-a-chip, system-in-a-package, programmable logic controls, energy storage systems, and all-electronic systems.
Earthquakes generated in subduction zones are caused by unstable
movements along faults. This fault-slip instability is determined by
frictional forces that depend on the temperature, pressure, morphology
and deformation state of the fault rocks. Fault friction may also be
influenced by preferred mineral orientations. Over-thrusting of rocks at
the interface between a subducting slab and the overlying mantle wedge
generates shear deformation that causes minerals to align, and this
preferred mineral orientation affects the propagation of shear seismic
waves. Here we use laboratory experiments to simulate fault slip in
antigorite, the most abundant hydrous mineral phase within Earth's upper
mantle. Using atomic force microscopy, we show that antigorite single
crystals possess strong frictional anisotropy on their basal slip
surface and that preferred mineral alignment extends this property to a
regional scale. Depending on the alignment, fault movements can occur
along a high-friction direction, creating stick-slip behaviour that
generates earthquakes. In contrast, if movements occur along a
low-friction direction, the mantle wedge will deform aseismically. Our
results imply that mantle rocks in subduction-zone thrust faults can
exhibit two opposite frictional behaviours, seismic and aseismic.
Friction hodographs contain all the information related to the intensity and symmetry of the friction phenomenon. We show how an atomic force microscope can be used to collect friction hodographs at the nanoscale and how to carry out data interpretation to unravel the friction–surface structure relationship. As a model system, we analyzed the basal plane of orthorhombic β-alanine single crystals, and interpreted the data in terms of a constitutive model of orthotropic friction with slip direction-dependent friction coefficients.
We present an overview of our research on nanoelectronics and nanomechanics based on low-dimensional materials, including carbon nanotubes and graphene. Our primary research focus is on carbon nanotube and graphene architectures for electronics, energy harvesting, and sensing applications. We are also investigating an atomically precise graphene nanomachining method as well as a high-throughput desktop nanolithography process. In addition, we are exploiting nanomechanical actuators and nanoscale measurement techniques for reconfigurable arrayed nanostructures with applications in THz antennas, remote detectors, and biomedical nanorobots. Last, we are studying the effect of antibody functionalized nickel nanowires to improve cell separation techniques. These design, nanofabrication, manipulation, and characterization processes will enable next-generation nanoelectronics that have a wide range of applications including sensors, detectors, system-on-a-chip, system-in-a-package, programmable logic controls, energy storage systems, and all-electronic systems. (C) 2010 Society of Photo-Optical Instrumentation Engineers. [DOI: 10.1117/1.3492411]
We are exploring nanoelectronic engineering areas based on low dimensional materials, including carbon nanotubes and graphene. Our primary research focus is investigating carbon nanotube and graphene architectures for field emission applications, energy harvesting and sensing. In a second effort, we are developing a high-throughput desktop nanolithography process. Lastly, we are studying nanomechanical actuators and associated nanoscale measurement techniques for re-configurable arrayed nanostructures with applications in antennas, remote detectors and biomedical nanorobots. The devices we fabricate, assemble, manipulate and characterize potentially have a wide range of applications including sensors, detectors, system-on-a-chip, system-in-a-package, programmable logic controls, energy storage systems and allelectronic systems.
