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(a) Negative-ion TOF–SIMS depth profile of a C 60 (40 nm)/ P3HT(35 nm)/PEDOT:PSS(80 nm)/ITO(125 nm)/glass multilayer before annealing. Data of the marker fragments for the individual layers were recorded under conditions described in the text. Note that due to the lower sputter rate of C 60 , the depth scale starts at 1500 s. (b) TOF–SIMS profile of negative secondary ions from the same layer stack after thermal annealing at 150 1C for 30 min. The chemical structures corresponding to the detected masses are indicated in the graph.  

(a) Negative-ion TOF–SIMS depth profile of a C 60 (40 nm)/ P3HT(35 nm)/PEDOT:PSS(80 nm)/ITO(125 nm)/glass multilayer before annealing. Data of the marker fragments for the individual layers were recorded under conditions described in the text. Note that due to the lower sputter rate of C 60 , the depth scale starts at 1500 s. (b) TOF–SIMS profile of negative secondary ions from the same layer stack after thermal annealing at 150 1C for 30 min. The chemical structures corresponding to the detected masses are indicated in the graph.  

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Article
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The performance of heterojunction organic solar cells is critically dependent on the morphology of the donor and acceptor components in the active film. We report results of photovoltaic devices consisting of bilayers and bulk heterojunctions using poly(3-hexylthiophene) (P3HT) and Buckminsterfullerene C60. White light power efficiencies of η∼2.2%...

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... not present in P3HT. Although also recorded and analyzed, the positive ion TOF-SIMS spectra were more complex, and signal mismatch due to the absence of C 60 -specific carbon signals after sputtering with O 2 À made marker selection in the positive ion mode difficult. Consequently, only negative-ion secondary ion TOF-SIMS data are discussed here. Fig. 6 shows the depth profiles of a C 60 /P3HT/ PEDOT:PSS/ITO/glass multilayer structure before (as-produced, Fig. 6a) and after (Fig. 6b) annealing at 150 1C for 30 min. We also tried to extract numerical values for sputter rates from crater depth measurements using a stylus profilometer. However, while such measurements can be applied to ...
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... and signal mismatch due to the absence of C 60 -specific carbon signals after sputtering with O 2 À made marker selection in the positive ion mode difficult. Consequently, only negative-ion secondary ion TOF-SIMS data are discussed here. Fig. 6 shows the depth profiles of a C 60 /P3HT/ PEDOT:PSS/ITO/glass multilayer structure before (as-produced, Fig. 6a) and after (Fig. 6b) annealing at 150 1C for 30 min. We also tried to extract numerical values for sputter rates from crater depth measurements using a stylus profilometer. However, while such measurements can be applied to inorganic layers with some confidence (particularly in dynamic SIMS experiments), the much more pronounced ...
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... due to the absence of C 60 -specific carbon signals after sputtering with O 2 À made marker selection in the positive ion mode difficult. Consequently, only negative-ion secondary ion TOF-SIMS data are discussed here. Fig. 6 shows the depth profiles of a C 60 /P3HT/ PEDOT:PSS/ITO/glass multilayer structure before (as-produced, Fig. 6a) and after (Fig. 6b) annealing at 150 1C for 30 min. We also tried to extract numerical values for sputter rates from crater depth measurements using a stylus profilometer. However, while such measurements can be applied to inorganic layers with some confidence (particularly in dynamic SIMS experiments), the much more pronounced roughening of the sputter ...
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... and depth profiles are presented with a starting time of 1500 s to clarify experimental details. Data collection was performed at a location without an aluminum layer belonging to the cathode. By this way we could avoid conflicting effects from the metal. Aluminum is only present in the thin film stack in a very small amount as shown in Figs. 6a and b. The organic layer system was removed from the ITO film and measured from the backside with PEDOT:PSS as top layer as well. No striking difference was found in the reverse depth profile in the negative secondary ion mode as compared with data shown in Fig. 6. Following the C 60 marker signals (C 6 À and C 9 À ) in the as- deposited ...
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... is only present in the thin film stack in a very small amount as shown in Figs. 6a and b. The organic layer system was removed from the ITO film and measured from the backside with PEDOT:PSS as top layer as well. No striking difference was found in the reverse depth profile in the negative secondary ion mode as compared with data shown in Fig. 6. Following the C 60 marker signals (C 6 À and C 9 À ) in the as- deposited sample, a decrease of the signals is visible around 2100 s. A steep increase of the previously absent C 4 HS À signal indicates the presence of the C 60 /P3HT interface. While the sulfur containing signal continues to increase, the C 60 markers show a small ...

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... This hybrid route of LbL OPV fabrication enabled the incorporation of C 60 and C 70 acceptors with donor polymers or soluble small molecule such as ADPM, cyanines, squaraines and porphyrins. 62,63,66,68,72,73,75,77,78,83,84,86,87,[91][92][93][94][95][96][97][98][99][100][101][104][105][106][107][108]110,112,166,[194][195][196][197][198][199][200][201][202][203][204][205][206][207] Some examples of evaporated phthalocyanine-based NFAs have also been reported. 88,109,208 A summary of device performances and processing conditions from hybrid LbL OPVs prepared from thermally evaporated acceptors can be found in Table 9. ...
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... 150 P3HT has high charge carrier mobilities which is one of the disadvantages that organic solar harvesting materials often face. 151 It is relatively easy to synthesize and the regioregularity can be easily controlled. Regioregularity is important for the absorption and charge carrier mobilities. ...
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... 7 In many cases, active materials have been deposited as bilayers, 14,15,19,20 or interdigitated heterojunctions, usually using soluble fullerene derivatives [21][22][23] rather than pristine C 60 . 24 Nanoporous C 60 lms with morphological features in the range of the typical exciton diffusion length, $10-20 nm in comparable systems, 16,25,26 would offer an attractive alternative to bilayers in bicomponent systems that do not phase-separate spontaneously to form an optimal bulk heterojunction morphology. ...
... Reports on C 60 /P3HT solar cells are scarce, because of the low solubility of C 60 in organic solvents and because the two components do not spontaneously phase-separate to form an optimal bulk-heterojunction morphology, limiting drastically the cell performance. 24 One solution found by Geiser et al. was to anneal the whole device to force the morphology to evolve favorably, reaching over 2% in PCE. 24 Even if the nal PCE shown here does not reach that of bulk-heterojunction fullerene/P3HT devices, the solution proposed, using a C 60 lm stabilized in an optimal morphology, can be seen as rather universal and opens important improvement possibilities for other working systems. ...
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... For several decades, polymer based organic photovoltaic cells (OPVCs) have been intensively investigated due to their high potential for low-cost, simple, and large-scale processability, in particular, from solution. [1][2][3][4][5][6][7][8][9] Key material parameters that impact both the short-circuit current density (J SC ) and the open-circuit voltage (V OC ) in OPVCs 10 are the hole and electron mobilities of the donor and acceptor materials, respectively. On the one hand, too high mobilities can be detrimental to device performance, which is reflected in a decrease in V oc . ...
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... [1][2][3] The system consisting of regioregular poly(3-hexylthiophene) (P3HT) and fullerene derivative [6,6]-phenyl C 61 butyric acid methyl ester (PCBM) has shown power conversion efficiencies of about 4-5% under standard solar conditions. [4][5][6][7] Precise control of the molecular structure of such complex organic multilayers, e.g. chemical purity, 8 layer uniformity, morphology, 9 phase separation and interfaces, 10,11 diffusion, 12,13 and effects of annealing, 14,15 is required in order to improve the performance of the devices and the characterization remains a challenge. To address these questions, molecular analysis by secondary ion mass spectrometry (SIMS) constitutes a method of choice. ...
... 22 Low energy Cs + ions provide interesting results for a series of polymers which are problematic for SF 5 + and C 60 n+ sputtering, such as polystyrene and polycarbonate, 23 but crater bottom roughening and probable degradation of fullerenes were reported for P3HT:C 60 heterojunction solar cells. 15 Large noble gas cluster ions have already proven to deliver better performance than SF 5 + and C 60 n+ when the other beams failed 24 and there are some reports concerning organic electronic layers. 25 In particular, OLED multilayers including Alq3 and other molecules could be successfully depth proled with large Ar clusters. ...
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... For these thicknesses, achieving suitable percolation pathways and phase separation simultaneously in the range of the exciton diffusion length (approximately 10 nm) is challenging,567 so great effort has been invested into controlling the morphology of the blends by choosing appropriate solvents or by employing annealing treatments891011 . Despite these optimizations, discontinuous pathways to the external electrodes are still a problem and result in the recombination of photogenerated charges, limiting charge extraction and efficiency1213141516. Although more 'ideal' geometries consisting of interdigitated donor and acceptor phases have been proposed as an alternative to bulk heterojunctions17181920, these structures are difficult to achieve and low carrier mobilities would still inhibit charge collection from their thick active layers. ...
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