The cross-sectional HRTEM image of the Bi2Te3/Fe1+yTe thin film sample. (a) The full

The cross-sectional HRTEM image of the Bi2Te3/Fe1+yTe thin film sample. (a) The full

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Bi2Te3/Fe1+yTe heterostructures are known to exhibit interfacial superconductivity between two non-superconducting materials: Fe1+yTe as the parent compound of Fe-based superconducting materials and the topological insulator Bi2Te3. Here, we present a top-down approach starting from two-dimensional heterostructures and using a focused ion beam tech...

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... heterostructure sample grown in a VG V80H MBE system. images were captured using a JEOL JEM 2010F TEM. Fig. 6 shows a schematic diagram of the fabrication process of Bi2Te3/Fe1+yTe nanowires for electrical measurements with two probes. The thicknesses of the different layers of the thin film sample were measured using the HRTEM images shown in Fig. 7. The Bi2Te3/Fe1+yTe nanowires were fabricated in the dual-beam FIB/FESEM system using a Ga + ion beam source at 30 keV. The ion beam source current ranged from 1 pA to 65 nA for different aspects. A high surface flatness region was used to fabricate the Bi2Te3/Fe1+yTe nanowire, which was investigated using tilted SEM and FIB images. ...