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Microcantilever physical model and schematic diagram. (a) Microcantilever schematic diagram. (b) Physical model of the microcantilever. 

Microcantilever physical model and schematic diagram. (a) Microcantilever schematic diagram. (b) Physical model of the microcantilever. 

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The tapping mode is one of the mostly employed techniques in atomic force microscopy due to its accurate imaging quality for a wide variety of surfaces. However, chaotic microcantilever motion impairs the obtention of accurate images from the sample surfaces. In order to investigate the problem the tapping mode atomic force microscope is modeled an...

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... the mid 1980s the atomic force microscope (AFM) is a powerful tool to surface investigation in Engineering, Physics, Biology, Medicine and Nanotechnology. 1–4 Additionally, since 1993, the tapping mode atomic force microscope (TM-AFM) is one of the mostly employed dynamic AFM techniques due to its accurate imaging quality for a wide variety of surfaces. 5–7 A typical AFM system ( Figure 1) consists of a microcantilever probe with a sharp tip assembled on a piezoelectric scanner (PZT). The tip–sample interaction forces deform the microcantilever shape bending it upwards or downwards depending on whether the resultant force is attractive or repulsive. The position of the microcantilever is determined by a photo- diode in which a laser beam, reflected from the microcantilever’s surface, incides. 4 Since the AFM is actually a force sensor, the microcantilever bending is measured and translated to the corresponding force signal. A comprehensive review of the force–distance theoretical background, as well as the great variety of measurements that can be performed by the AFM, can be found in Cappella and Dietler. 8 The dinamic AFM techniques can be classified as noncontact AFM, such as frequency modulation AFM (FM-AFM), or tapping mode AFM (TM-AFM). The TM-AFM or intermittent contact AFM is an amplitude modulation AFM (AM- AFM) technique. For noncontact AFM techniques the tip–sample interaction forces are governed by a potential interaction. On the other hand, in the TM- AFM technique the tip–sample interaction forces include both friction and attraction/repulsion potential interaction forces. The tip–sample interaction forces involve short and long range intermolecular forces. Additionally, microcantilevers have several distinct eigenmodes and the tip–sample interaction forces are highly nonlinear. 6,7,9–11 The interest for nonlinear dynamics in the AFM grew from observations of instabilities that occur at certain amplitudes of operation of the microcantilever oscillation. 12,13 This problem leads to the need of a new AFM generation with reduced imaging forces and the development of new methods to improve material contrast and sensitivity. It has been experimentally observed that under certain conditions of operation the TM-AFM presents chaotic behavior. 14 The existence of chaotic behavior is undesirable since this type of complex motion impairs the AFM measurements, resulting in inaccurate and low resolution topographic images. The per- fomance of the AFM can be improved by eliminating the possibility of chaotic motion, which can be done either by changing the AFM operating conditions to a region of the parameter space where regular motion is assured, 15 or by designing an active contoller that stabilizes the system on one of its unstable periodic orbits. 16 In the following section the mathematical model of the TM-AFM is obtained, and the analysis of the dynamical system is performed considering: bifurcation diagrams, phase portraits, time histories, Poincare ́ maps, attraction basins, Lyapunov exponents, and simulations. Later the state feedback and time-delayed control techniques are implemented. Computer simulations are used in order to verify e ffi ciency and robustness to parametric errors of both control techniques. Finally, the concluding remarks are presented. In this section the mathematical model of the TM- AFM is developed. According to Jhang et al., 3 the first mode of vibration of the microcantilever can be considered as a mass-spring-damper system as shown in the lumped parameter model 17 in Figure 2. According to that, the microcantilever governing equation of motion is given ...

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... The results revealed that the chaotic motion of the system decreases with considering the squeeze film damping. This model developed in [19] and two control techniques (the optimal linear feedback control and the time-delayed feedback control) were used to suppress the chaotic motion in the tapping mode atomic force microscope. ...
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