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This paper presents BIST TPG (built in self test) for low power dissipation and high fault coverage a low hardware overhead test pattern generator (TPG) for scan-based built-in self-test (BIST) that can reduce switching activity in circuits under test (CUTs) during BIST and also achieve very high fault coverage with reasonable lengths of test seque...
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BIST TPG (built in self test) for low power dissipation and high fault coverage presents a low hardware overhead test pattern generator (TPG) for scan-based built-in self-test (BIST) that can reduce switching activity in circuits under test (CUTs) during BIST and also achieve very high fault coverage with reasonable lengths of test sequences. The p...
