Layout of the flatbed scanner elements (without the optical system elements): 1-light source, 2-object, 3-fixed glass, 4-photodetectors, 5-scanner carriage; SL and MRL are the scattered and the specularly reflected light, respectively. A flatbed scanner that is a relatively easy-to-use device for reading images and texts from printed materials can serve as an excellent tool to obtain and subsequently analyze object images, i.e., for contactless non-invasive diagnostic scanning. Let's emphasize the value of the scanner as an instrument for physical research: the scanner is a complete experimental setup for observing the scattered light from the flat objects in the visible wavelength range; the scanner has 'flat' optical characteristics as opposed to devices with spherical or cylindrical optical systems (cameras, video cameras, microscopes and so on.) This allows to eliminate the errors arising from controlling the uniformity of the properties of studied flat objects; a non-contact scanner reads/scans the information 'line by line' in contrast to the serial line reading in most contact scanning technologies of various modern microprobe methods (such as profilers and various scanning microscopes, e.g., an

Layout of the flatbed scanner elements (without the optical system elements): 1-light source, 2-object, 3-fixed glass, 4-photodetectors, 5-scanner carriage; SL and MRL are the scattered and the specularly reflected light, respectively. A flatbed scanner that is a relatively easy-to-use device for reading images and texts from printed materials can serve as an excellent tool to obtain and subsequently analyze object images, i.e., for contactless non-invasive diagnostic scanning. Let's emphasize the value of the scanner as an instrument for physical research: the scanner is a complete experimental setup for observing the scattered light from the flat objects in the visible wavelength range; the scanner has 'flat' optical characteristics as opposed to devices with spherical or cylindrical optical systems (cameras, video cameras, microscopes and so on.) This allows to eliminate the errors arising from controlling the uniformity of the properties of studied flat objects; a non-contact scanner reads/scans the information 'line by line' in contrast to the serial line reading in most contact scanning technologies of various modern microprobe methods (such as profilers and various scanning microscopes, e.g., an

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A new method for nondestructive testing of the optical properties of various materials (semiconductors, dielectrics and metals) has been presented. It is based on the determination of geometric and optical inhomogeneities of the objects using the measurement data on the objects characteristics of the light scattered by them. It has been proposed to...

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