Figure S2: Detailed view for the theoretical Psi-Delta plots calculated for thin films, each mark indicates an increase of the thickness of 4 Å, adsorbed on both substrates: silicon with an oxide layer of 310 Å (a) and gold (b). Parameters used: angle of incidence ( i = 67.96°); wavelength ( = 4429 Å); buffer refractive index (n b = 1.343); substrate complex