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Electrical characteristics of sub-100-nm bilayer WSe2 transistors
a, Schematic of the fabrication process of ultrashort-channel WSe2 transistors with VSe2 contacts. b, Optical microscopy images of the device structure. Scale bar, 5 μm. c,f, SEM images of bilayer WSe2 transistors with channel lengths of 76 nm (c) and 20 nm (f). Scale bars, 100 nm. d,g, Output characteristics of the 76 nm (d) and 20 nm (g) WSe2 transistors at various back-gate voltages (Vgs) with a step of 5 V. e,h, Transfer curves of the 76 nm (e) and 20 nm (h) bilayer WSe2 transistors at various bias voltages.

Electrical characteristics of sub-100-nm bilayer WSe2 transistors a, Schematic of the fabrication process of ultrashort-channel WSe2 transistors with VSe2 contacts. b, Optical microscopy images of the device structure. Scale bar, 5 μm. c,f, SEM images of bilayer WSe2 transistors with channel lengths of 76 nm (c) and 20 nm (f). Scale bars, 100 nm. d,g, Output characteristics of the 76 nm (d) and 20 nm (g) WSe2 transistors at various back-gate voltages (Vgs) with a step of 5 V. e,h, Transfer curves of the 76 nm (e) and 20 nm (h) bilayer WSe2 transistors at various bias voltages.

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