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Dielectric constant depends on temperature at selected frequency for 15 nm BTO ceramics. 

Dielectric constant depends on temperature at selected frequency for 15 nm BTO ceramics. 

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The complex dielectric response of ultrafine grain barium titanate ceramics is investigated using broadband dielectric spectrometer. Extrinsic effects like conduction, space charge associating with grain boundaries are discussed. One dielectric relaxation ascribes to the interaction of defects with grain boundaries, for which the activation energy...

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... titanate BTO -based ceramics is one of the most attractive ferroelectric material for the use of multilayer 1 capacitors. However, the BTO-based ceramics show unusual dielectric characteristics when its grain size down to nanoscale. Comparing with coarse BTO ceramics, the conductivity of 35 nm nanocrystalline enhances one to two orders of mag- 2 nitude due to a greatly reduced oxidation enthalpy. Colossal permittivity present in ultrafine grain nonstoichiometric BTO ceramics, which is ascribed to small polarons based on elec- tronic hopping of Ti 3+ / Ti 4+ . 3 And the dielectric properties are more susceptible to grain boundary for nanocrystalline 4,5 BTO ceramics, so called “dilute the effects of grain size.” Dielectric response mechanism, effectively deduced by dielectric relaxation investigation, is closely to dielectric 6 7 like fluctuation of dipolar, ferroelectric domain, interfacial 8,9 polarization, and structural defect in ferroelectric 10,11 ceramics, etc. For nanocrystalline BTO ceramics, the ef- fective permittivity will be controlled by the combination of the intrinsic size effect and of the “dilution” effect due to the 5 nonferroelectric grain boundaries, at which an interfacial 12 polarization could be induced, thus, the electrical properties were susceptible to the space charge and chemical defects. Here we investigated the dielectric properties of 15 nm BTO ceramics. Dielectric relaxation and its dominant extrinsic effects like conductions, space charge between grains were discussed. BTO ceramics with an average grain size of 13 15 nm were prepared as reported elsewhere. The relative density determined by Archimedes’ method is 98.6%. X-ray diffraction ͑ XRD ͒ , atomic force microscopy ͑ AFM ͒ , x-ray photoelectron spectroscopy ͑ XPS ͒ , and transmission electron microscopy ͑ TEM ͒ were used to characterize the microstruc- ture of the samples. Dielectric properties were studied on a broadband dielectric spectrometer. Figure 1 ͑ a ͒ demonstrates that the crystal structure is BTO and the average grain size calculated by Scherrer for- mula in ͑ 200 ͒ diffractive plane is 16.7 nm, the value shifts to 19.3 nm deduced from the inner of Fig. 1 ͑ a ͒ after thermal treatment. Thus, the thermal treatment does not induce ap- parent growth of ceramics grain. The grain size determined by AFM topography of the surface is about 15 nm illustrated in Fig. 1 ͑ b ͒ . Binding energy of Ti 2 p 3 / 2 marked in Line 1 is derived 457.43 eV from XPS analysis, which is smaller than that reported for standard BTO ceramics spectrum, demon- strating that the valence of Ti in BTO ceramics shifts from Ti 4+ to Ti 3+ in order to balance the oxygen vacancies. However, the oxygen vacancies cannot be efficiently compen- sated after thermal treatment in air atmosphere because binding energy of Ti 2 p 3 / 2 marked in Line 2 is derived 457.13 eV in Fig. 1 ͑ c ͒ . The grain boundary and ferroelectric domain detected by TEM present in the samples ͑ figures are not shown here ͒ . Dielectric response of 15 nm BTO ceramics, examined in terms of dielectric constant, dependence of temperature is showed in Fig. 2. Some interesting features can be observed as follows: ͑ 1 ͒ at approximately megahertz frequency, one dielectric response peak corresponding to phase transition from ferroelectric to paraelectric displays disperse behavior, which consists with our previous works. 14,15 ͑ 2 ͒ With the measured frequency decline to tens to hundreds of kilohertz, dielectric constant increases with further increasing temperature after Curie phase transition, the same results were re- 16 ported for 50 nm dense nanocrystalline BTO ceramics. What’s more, relaxation phenomenon locates in the paraelectric phase. ͑ 3 ͒ With further decreasing frequencies to 1 kHz or even lower, the dielectric constant present two pronounced relaxation processes. The ferroelectric to paraelectric phase transition can be attributed to the relaxation process associated with the do- main reorientation, domain wall emotion, and the dipolar 17 behavior. However, the dielectric abnormal of paraelectric phase indicates that the extrinsic mechanisms like space charge polarization and/or nonignorable ionic conductivity dominate dielectric behaviors. The breadth of dielectric constant in the paraelectric phase propose existing the composi- tional fluctuations of Ti 4+ / Ti 3+ , which indicates the existence of oxygen vacancies and released electron. Figures 3 ͑ a ͒ and 3 ͑ b ͒ illustrated dielectric relaxation and accompanied activation energy, respectively. A sharp incre- ment of the real dielectric constant appears at the frequency lower than 10 Hz, accompanying with a wide and promi- nent dielectric loss peak in Fig. 3 ͑ b ͒ . The peak shifts to higher frequency with increasing temperature, indicating a 18,19 thermally activated relaxation process, which probably 11 relates to the motion of oxygen vacancies. The results of XPS measurements support this assumption. Furthermore, activated energy was confirmed through Arrhenius law fitting, written as follow: = 0 exp − E a k B T , 1 where ␶ is relaxation time, E a represents the activated energy, k B is Boltzmann constant, and T corresponds to the absolute temperature. Our excellent fit yields activation energy of re- laxation process to be 0.26 eV, the value increases to 0.41 eV ͑ the relaxation process locates at lower temperature and frequency ͒ with the samples annealed at 873 K for 30 h. Lewis 20 and co-workers reported that the experimental diffusion energy for vacancies of oxygen is 0.4–0.68 eV. So it is reason- able to believe that the dielectric relaxation induced by the oxygen defects. Because grain boundary facilitates the defect reaction, the activation energy was remarkably lower in 2 nanocrystalline BTO ceramics. Thus, the activation energy in the present study is lower than the previous work may be ascribed to the accumulation of electron released by the for- mation of oxygen vacancies at grain boundaries. Another interesting characterization is that the real dielectric constant increases sharply with decreasing frequency and reaches maximum ϳ 70 000 at higher temperature dis- played in Fig. 3 ͑ a ͒ . However, the colossal permittivity is not originated from the intrinsic mechanism but probably results from interfacial polarization model, also called Maxwell– Wagner effect, which was usually adopted to explain the dielectric relaxation with extremely high dielectric constant and found to be intensively reported for BTO-based thin 21,22 films ceramics capacitor and deficient BTO-based 3 ceramics. When an electric current passes through interfaces between two different dielectric media because of their different conductivities, surface charges pile up at the interfaces, and give rise to a Debye-like relaxation process under 23 an external alternating voltage. The imaginary modulus, the reciprocal of the imaginary permittivity ͑ because the value of tan ␦ is rather high at low frequency which makes the relaxation peak difficult to distinguish ͒ depends on measured frequency with the temperature higher than T C ͓ see Fig. 3 ͑ b ͔͒ , using Arrhenius law fitting, written as follows: f m = f 0 − E a k B T , 2 where f m is maximum relaxation frequency, f 0 is the prefac- tor, as shown in the inset of ͑ b ͒ of Fig. 3, indicate that the dielectric responses are Maxwell–Wagner relaxation and the E a values are obtained to be 0.58 eV and 1.01 eV for as- prepared and annealed samples, respectively. The complex impedance spectra can present two semi- circles modeled with an equivalent electrical circuit includ- ing resistor R and capacitor C elements composed of two parallel elements connected in series. One semicircle shows lower impedance corresponding to grain while the other locating at low frequency relates to grain boundary which 24 makes considerable contribution to the impedance. In this work, the inset of Fig. 4 displays only one arc over the frequency range of 1 Hz to 3 MHz, however, the impedance without zero intercept ͑ about 45 ⍀ at 374 K and at 3 MHz ͒ reaches the order of ϳ 10 7 at low frequency, which suggests that a small semicircle with a low impedance exists at higher frequency. However, with measured temperature and frequency increasing, the grain and grain boundary can be sepa- rated. It can be concluded that one rather small high- frequency semicircle for the grain and a rather large arc for the grain boundary. What’s more, the deviation from large semicircle at even low frequency results from interfacial polarization as discussed above. In summary, ultrafine grain BTO ceramics show unusual dielectric response. The extrinsic relaxation mechanisms like interfacial polarization, ionic conductivity polarization is predominant This work for was the supported ultrafine grain by the size 863-project BTO ceramics, under Grant even they No. are 2007AA03Z524, highly-dense and and possess the National of ferroelectric Natural domains. Science Foundation of China ͑ NSFC ͒ under Grant No. 50872094, and Hainan University Research Fund. This work was supported by the 863-project under Grant No. 2007AA03Z524, and the National Natural Science Foundation of China ͑ NSFC ͒ under Grant No. 50872094, and Hainan University Research ...

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... 1-4 Complex oxides comprise of a large class of compounds for which the opportunity to combine magnetic and electrical elements continues to grow, leading to interesting physical outcomes, such as giant magnetoresistance, 5 multiferroic, 6 electrocaloric 7 and magnetocaloric 8 properties. Building on our own version of sol-gel/solvothermal synthesis 9,10 and drawing from research of perovskite oxides, [11][12][13][14][15][16][17][18][19] we aim to explore the dielectric properties at the nanoscale. These compounds have special crystal structures, compositions and micro-(nano-) structures, opening a window of opportunity for future materials, and potentially some undiscovered properties to emerge as a consequence of the structure-property relationships. ...
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We report the activation field and selective frequency-dependent ferroelectric behavior of BaMn3Ti4O14.25 (BMT-134) at room temperature. BMT-134, a recently discovered multiferroic complex oxide, exhibits antiferromagnetic and ferroelectric behavior and belongs to the hollandite crystal class. The microstructure can be manipulated through processing conditions to prepare a nanocrystalline textured tablet. We measured polarization-electric field (P-E) hysteresis loops and strain-electric field butterfly loops as a function of frequency in order to investigate the AC dynamics of domain switching and strain behavior. Under an electric field loading condition, a clear hysteresis loop of the electric field-displacement curve is obtained at 50 Hz, indicating that room temperature ferroelectricity is attainable under the right processing conditions. When the frequency is increased to 500 Hz, the coercive field also increases, until the frequency reaches 5 kHz, at which point the electric field versus electric displacement becomes linear indicating the limit of domain switching at high frequency.
... The relaxor ferroelectrics belong to the family of perovskites, such as (PMN), Pb(Sc 1/2 Ta 1/2 )O 3 (PST), (PbLa)(ZrTi)O 3 (PLZT) and Ba(Zr 0.25 Ti 0.75 )O 3 [14][15][16][17][18]. However FE materials are reported to exhibit frequency dependent diffused phase transition due to the extrinsic effects such as small grain size [19], thickness of the nanocrystalline thin films [20] and electrode polarization [21]. Similarly as the annealing temperature and applied ac frequency increases a systematic increase in the dielectric peak associated with the C-T transition has been reported for Ba 0.6 Sr 0.4 TiO 3 [22]. ...
... Similarly as the annealing temperature and applied ac frequency increases a systematic increase in the dielectric peak associated with the C-T transition has been reported for Ba 0.6 Sr 0.4 TiO 3 [22]. The observation of artificial relaxor like feature in bulk and thin film FE materials was attributed to the grain size effects, accumulation of charges at the grain boundaries and electrical conductivity [20]. ...
... Morphological analysis reveal the effects of the extrinsic factors on the dielectric response, and these findings are consistent with the literature that indicates frequency dependent diffused phase transition due to the small grain size [19], thickness of the nanocrystalline thin films [20] and electrode polarization [21]. Similarly, as the annealing temperature and applied ac frequency increases, a systematic increase in the intensity of the dielectric peak associated with the C-T transition have been reported for Ba 0.6 Sr 0.4 TiO 3 [22]. ...
... However, there are many causes for size effects in ferroelectrics and is often difficult to separate true size effects from other factors that change with particle/grain size [16][17][18][19]. The stability of the ferroelectric phase can be determined by additional factors like defect chemistry, incorporation of foreign atoms and bulk hydroxyl groups, aggregation level of particles, porosity level, residual stresses, etc. [3,20,21]. In fact, it has been theoretically demonstrated that besides grain size, internal stresses also affect the structural, ferroelectric and dielectric properties of fine grained BTO ceramics [22,23]. ...
... An additional consideration concerns the electrical boundary conditions in ferroelectric materials. The spontaneous polarization creates depolarization fields that require compensating charges near or at the surfaces/interfaces [19][20][21][22][23][24][25][26][27][28]. If for some reason a spontaneous polarization would not be compensated by charge, the consequence of the necessary boundary condition of zero polarization at the free surface would be an internal electrical field oriented in opposition to the polarization itself. ...