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By focusing on single failure scenarios in open-loop, the failure model can be made fairly simple.

By focusing on single failure scenarios in open-loop, the failure model can be made fairly simple.

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Conference Paper
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Model checking has been successfully used for detailed formal verification of instrumentation and control (I&C) systems, as long as the focus has been on the application logic, alone. In safety-critical applications, fault tolerance is also an important aspect, but introducing I&C hardware failure modes to the formal models comes at a significant c...

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Context 1
... of specifying a full failure model allowing all the processors and communication links fail (as in [22]), we can simplify the model (see Fig. 2) by keeping our focus on verifying single fault tolerance in open-loop models. To illustrate the idea, we use the U.S. EPR PS (see Section II-B) as an example: 1) First of all, it suffices to fully model only one division (APU+ALU). If the divisions are identical, any verifi- cation result for the included (non-failing, see below) ALU ...
Context 2
... failure model is implemented in NuSMV by inserting modules on one division to all signals (1) from the SCDS to the APUs and (2) from the APUs to the included ALU (see Fig. 2). Module FAULT_BIN is used for Boolean and FAULT_ANA for integer signals. At any time instant, the module can nondeterministically enter a fault mode, and replace the actual signal value with a nondeterministic variable. The status of the signal is also nondeterministic, meaning that the failure can be either self announcing (status = ...
Context 3
... of specifying a full failure model allowing all the processors and communication links fail (as in [22]), we can simplify the model (see Fig. 2) by keeping our focus on verifying single fault tolerance in open-loop models. To illustrate the idea, we use the U.S. EPR PS (see Section II-B) as an example: 1) First of all, it suffices to fully model only one division (APU+ALU). If the divisions are identical, any verification result for the included (non-failing, see below) ALU ...
Context 4
... failure model is implemented in NuSMV by inserting modules on one division to all signals (1) from the SCDS to the APUs and (2) from the APUs to the included ALU (see Fig. 2). Module FAULT_BIN is used for Boolean and FAULT_ANA for integer signals. At any time instant, the module can nondeterministically enter a fault mode, and replace the actual signal value with a nondeterministic variable. The status of the signal is also nondeterministic, meaning that the failure can be either self announcing (status = ...

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