Figure 1 - uploaded by Andrew Richardson
Content may be subject to copyright.
Source publication
For next generation mixed signal ICs, the integration of Design-for-Testability and Built-In Self-Test structures is expected to be of crucial importance for satisfying quality and economic demands. The judgment and evaluation of such testability optimisations, however, requires a better understanding of circuit specific failure modes in deep sub-m...
Contexts in source publication
Context 1
... analogue section of the converter comprises a resistor ladder to generate the differential reference voltages, two amplifier arrays, a track and hold array, and a comparator array, as illustrated in Figure 1. Two groups of signal paths can be identified. ...
Similar publications
Memory Built-In Self-Test (MBIST) has become a standard industrial practice. Its quality is mainly determined by its fault detection capability in relationship to the the area overhead. The MBIST Address Generator (AG) is largely responsible for the fault detection capability, and has a significant contribution to the area overhead. This paper anal...
For System-on-Chips (SoCs) one of the most critical design constraints is power consumption. This paper presents memory built-in self-test (BIST) grouping methodology which takes into account the given peak power, power domains based on Unified Power Format (UPF) and optimal test time. The mentioned grouping criteria enable to perform power-aware m...
A practical analog-to-digital converter (ADC) introduces quantization error in excess of the ideal value and one way of expressing this is by comparing the value of this error with that of an ideal ADC. This comparison is known as the effective number of bits (ENOBs). It is accepted practice to measure ENOB using the signal-to-noise and distortion...
This paper proposes a low-cost test pattern generator for scan-based built-in self-test (BIST) schemes. Our method generates broadcast-based multiple single input change (BMSIC) vectors to fill more scan chains. The proposed algorithm, BMSIC-TPG, is based on our previous work multiple single-input change (MSIC)-TPG. The broadcast circuit expends MS...