A deconvolution model for FT-IR spectrum of ETFE-PEM with GD=10.2% in the spectral region of 1500-2000 cm -1 .

A deconvolution model for FT-IR spectrum of ETFE-PEM with GD=10.2% in the spectral region of 1500-2000 cm -1 .

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The water states of poly(styrene sulfonic acid) (PSSA) grafted poly(ethylene-co-tetrafluoroethylene) copolymers (ETFE-PEMs) with grafting degree (GD)=8.8-30.5% are investigated under ambient conditions by using FT-IR analysis. Detailed analysis of the FT-IR spectra of ETFE-PEMs allows the observation of each component of water in the two broad band...

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... in the following sections, we performed the analysis of FT-IR spectra in detail to explore the water states and water content in ETFE-PEMs with various GD values. Figure 2 shows the FT-IR spectrum of ETFE-PEM (GD=10.2%) with a band at 1500-2000 cm -1 due to the bent oscillation of the -OH group plus a peak at 1600 cm -1 representing the C=C group of polystyrene grafted onto the pristine film as represented above. ...

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... Recently, poly(styrene sulfonic acid)-grafted poly(ethyleneco-tetrafluoroethylene) (EP) electrolyte membranes (ETFE-PEMs) have been studied intensively to replace Nafion because of their competitive price, performance, and durability. Compared with Nafion, the ETFE-PEM shows greater mechanical strength, conductance, and microstructural stability under immersed conditions [6][7][8][9] . Positron annihilation lifetime spectroscopy (PALS) is a potential method that provides molecular and nanoscale information on the free-volume hole features of materials through the lifetime and annihilation intensity of positron and positronium (Ps) ions. ...
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Introduction: Recently, the free-volume hole features of poly(styrene sulfonic acid) (PSSA)-grafted poly(ethylene-co-tetrafluoroethylene) polymer electrolyte membranes (ETFE-PEMs) have been studied using positron annihilation lifetime spectroscopy (PALS) to determine the relationship between gas crossover through a PEM and a fuel cell. As one such series, this work investigates the source correction in PAL spectroscopic analysis for ETFE-PEM. Method: ETFE-PEM was prepared by radiation-induced graft polymerization and subsequent sulfonation. The free-volume hole characteristics of ETFE-PEM with a grafting degree (GD) of 106% were determined using PALS with and without source correction. Results: After source correction, the original-ETFE and ETFE-PEM strains exhibited increases in r3 (smaller radius of free-volume holes in the lamellar amorphous regions, the PSSA grafts, and the interface zones inside the lamellae) and r4 (larger radius of free-volume holes in the mobile amorphous layers and the PSSA grafts outside of the lamellae). In addition, the full width at half maximum (FWHM) of r3 is much greater than that of r4 due to the rearrangement in the mobile amorphous region and the polystyrene layers outside the lamellar structure. Conclusion: Source correction causes a significant change in the distribution curves of r3 for the original-ETFE and ETFE-PEM. Thus, source correction of positron annihilation lifetime spectroscopic analyses is an important issue for determining the o-Ps lifetime of polymers, which is near the lifetime of positrons in source materials.